Chun Rosenkranz Wang

US Patent:

20060291042, Dec 28, 2006

Filed:

May 17, 2006

Appl. No.:

11/435959

Inventors:

Robert Alfano - Bronx NY, US
Chun Wang - College Point NY, US
Pavel Shumyatsky - Tenafly NJ, US
Manuel Zevallos L. - Woodhaven NY, US

International Classification:

G02B 21/00

US Classification:

359368000

Abstract:

The computer-controlled optical scanning high magnification microscope imaging system with a large field of view disclosed herein overcomes a previous inability to achieve simultaneous high magnification and large field of view in microscopes. The subject imaging system includes galvanometer scanners, a CCD camera and high brightness LED sources at different wavelengths for rapid acquisition of a large number of high-resolution segmented tile images with a magnification of 800× each. The numerous segmented tiles combine to form a larger viewing field of the target, resulting in a compound image with an effective enlarged viewing area of 1.6×1.2 mm. The speed and sensitivity of the system make it suitable for high resolution image monitoring of a small segmented area of dimensions 320×240 μmwith a 4 μm resolution. The microscope can zoom in on each segment of the target without lost of resolution to attain a great degree of spatial detail. With its special capacities, this microscope would be beneficial to medicine, biology, semiconductor inspection, device analysis and quality control, as well as with multiphoton and fluorescence microscopes to image large fields with high resolution.