Chun K Wong

age ~63

from Silver Spring, MD

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Also known as:

Chun H Wong

Phone and address:: 3930 Wendy Ln, Silver Spring, MD 20906
(301)9427262

Connected to:

Chun Wong Phones & Addresses

3930 Wendy Ln, Silver Spring, MD 20906 • (301)9427262
Bethesda, MD

Work

Company:

Ng, Tam, Ko & Chan
Address:

Lawyers & Attorneys

Chun Wong - Lawyer

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Office:

Ng, Tam, Ko & Chan

ISLN:

919758214

Admitted:

1993

License Records

Chun Wan Wong

License #:

0402053474

Category:

Professional Engineer License

Name / Title

Company / Classification

Phones & Addresses

Chun Wong

FLYING DUMPLING, LLC

Chun Wong
Owner, Manager

China Wok
Eating Place

9762 Groffs Ml Dr, Garrison, MD 21117
(410)9983655

Chun Ying Wong
President

FLASH ELECTRONICS INTERNATIONAL

Isbn (Books And Publications)

Introduction to Mathematical Physics: Methods and Concepts

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Author
Chun Wa Wong

ISBN #
0195044738

Resumes

Chun Ha Wong

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Chun Wong

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Chun Fai Frankie Wong

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Chun Chung Wong

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Chun Hang Wong

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Host

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Industry:

Hospitality

Work:

Disney Parks & Resorts
Host

Chun Ho Wong

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Chun Fai Wong

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Industry:

Accounting

Education:

Tung Wah Group of Hospitals Kap Yan Directors' College 1992 - 1995
High school, General

Medicine Doctors

Chun T. Wong

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Specialties:

Gastroenterology

Work:

Total Chinatown Gastroenterology
98 E Broadway FL 6, New York, NY 10002
(212)9663316 (phone), (212)9663317 (fax)

Education:

Medical School
New York University School of Medicine
Graduated: 1999

Procedures:

Colonoscopy
Electrocardiogram (EKG or ECG)
Sigmoidoscopy
Upper Gastrointestinal Endoscopy
Vaccine Administration

Conditions:

Constipation
Gastric Cancer
Gastritis and Duodenitis
Infectious Liver Disease
Liver Cancer

Languages:

Chinese
English
Spanish

Description:

Dr. Wong graduated from the New York University School of Medicine in 1999. He works in New York, NY and specializes in Gastroenterology. Dr. Wong is affiliated with New York Presbyterian Lower Manhattan Hospital.

Us Patents

System And Method For Detecting Structural Damage
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US Patent:

20050072234, Apr 7, 2005
Filed:

May 20, 2004
Appl. No.:

10/849571
Inventors:

Weidong Zhu - Elkridge MD, US
Guangyao Xu - Baltimore MD, US
Nengan Zheng - Baltimore MD, US
Benjamin Emory - Baltimore MD, US
Chun Wong - Lubbock TX, US
International Classification:

G01H001/14
G01M007/08
US Classification:

073579000, 073012010, 702056000
Abstract:

A system and method for detecting structural damage is provided that utilizes a general order perturbation methodology involving multiple perturbation parameters. The perturbation methodology is used iteratively in conjunction with an optimization method to identify the stiffness parameters of structures using natural frequencies and/or mode shape information. The stiffness parameters are then used to determine the location and extent of damage in a structure. A novel stochastic model is developed to model the random impact series produced manually or to generate a random impact series in a random impact device. The random impact series method or the random impact device can be used to excite a structure and generate vibration information used to obtain the stiffness parameters of the structure. The method or the device can also just be used for modal testing purposes. The random impact device is a high energy, random, and high signal-to-noise ratio system.

System And Method For Detecting Structural Damage
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US Patent:

20080294354, Nov 27, 2008
Filed:

May 16, 2008
Appl. No.:

12/153348
Inventors:

Weidong Zhu - Elkridge MD, US
Guangyao Xu - Baltimore MD, US
Nengan Zheng - Baltimore MD, US
Benjamin Haynes Emory - Baltimore MD, US
Chun Nam Wong - Lubbock TX, US
International Classification:

G01N 29/12
G01N 29/46
US Classification:

702 39, 702 56
Abstract:

A system and method for detecting structural damage is provided that utilizes a general order perturbation methodology involving multiple perturbation parameters. The perturbation methodology is used iteratively in conjunction with an optimization method to identify the stiffness parameters of structures using natural frequencies and/or mode shape information. The stiffness parameters are then used to determine the location and extent of damage in a structure. A novel stochastic model is developed to model the random impact series produced manually or to generate a random impact series in a random impact device. The random impact series method or the random impact device can be used to excite a structure and generate vibration information used to obtain the stiffness parameters of the structure. The method or the device can also just be used for modal testing purposes. The random impact device is a high energy, random, and high signal-to-noise ratio system.