Chunyu Zhao

US Patent:

20050023352, Feb 3, 2005

Filed:

Aug 29, 2003

Appl. No.:

10/654574

Inventors:

Mehul Patel - Fort Salonga NY, US
David Shi - Stony Brook NY, US
Thomas Bianculli - Manorville NY, US
Chunyu Zhao - Moriches NY, US

International Classification:

G06K007/10
G06K007/14

US Classification:

235454000

Abstract:

An imaging and an illuminating engine is provided for an optical code reader to image and illuminate remote target indicia. The engine includes an image sensor for receiving reflected illumination from the remote indicia and at least two illumination assemblies for providing illumination of the remote indicia. Each illumination assembly is capable of providing a number of different outputs, such as light having different wavelengths or different output durations. A transmissive, optical element overlays the engine for preventing light generated by the at least two illumination assemblies from reflecting back towards the image sensor. The imaging engine is an integrated circuit package for easily inserted and interfacing within an optical code reader as a plug-and-play component.

US Patent:

20210361159, Nov 25, 2021

Filed:

May 18, 2021

Appl. No.:

17/323231

Inventors:

- Tucson AZ, US
Chunyu Zhao - Tucson AZ, US

International Classification:

A61B 3/10
A61B 3/15
G01B 9/021

Abstract:

An analytic tool for supporting alignment of an optical component in preparation for an interferometric test and performance of such a test. Apparatus and methods involve employment of the datum features on the optical component and/or metrology frame supporting such component. The metrology frame may include a secondary set of holograms (provided for use with a conventional system already employing a primary hologram that forms the testing optical wavefront). The conventional primary hologram is preferably substituted with a set of primary holograms (contained in the same, unitary or spatially-complementary housing sets) that perform different but complementary functions and that facilitate the alignment of the metrology frame with or without the tested optical component.