Curtis V Macchioni from 2374 Merlot Ln, Livermore, CA 94550, age 70, Phone: (925)2451109

Curtis Macchioni Phones & Addresses

2374 Merlot Ln, Livermore, CA 94550 • (925)2451109 • (925)3736217
4173 Caminito Davila, San Diego, CA 92122
Fremont, CA
La Jolla, CA
Albuquerque, NM
2374 Merlot Ln, Livermore, CA 94550 • (530)8630314

Work

Company:

Western digital
Feb 1, 2014 to Dec 2016
Position:

Senior director of manufacturing engineering

Education

School / High School:

Carnegie Mellon University
1976 to 1983
Specialities:

Physics, Philosophy

Skills

Program Management • Technology Product Development • Manufacturing Engineering • Product Development • Technology Transfer • Design of Experiments • Magnetic Recording • Disk Drive • Systems Engineering • Optical Devices • Optical Coatings • Engineering Management • Cross Functional Team Leadership • Failure Analysis • R&D • Manufacturing • Thin Films • Testing • Product Engineering • Product Management • Research and Development

Industries

Computer Hardware

Resumes

Senior Director Wafer Integration, Test, Failure Analysis, Yield And Quality

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Location:

3911 Dartmouth Way, Livermore, CA 94550

Industry:

Computer Hardware

Work:

Western Digital Feb 1, 2014 - Dec 2016
Senior Director of Manufacturing Engineering
Western Digital Feb 1, 2014 - Dec 2016
Senior Director Wafer Integration, Test, Failure Analysis, Yield and Quality
Western Digital Jan 2005 - Dec 2014
Director of Advanced Programs Management
Lockheed Martin Jun 1, 2003 - Jan 1, 2005
Senior Principal Systems Engineer
Wavesplitter Technologies 2000 - 2003
Manufacturing Engineering Manager

Education:

Carnegie Mellon University 1976 - 1983
Carnegie Mellon University 1972 - 1976
Bachelors, Bachelor of Science, Physics

Skills:

Program Management
Technology Product Development
Manufacturing Engineering
Product Development
Technology Transfer
Design of Experiments
Magnetic Recording
Disk Drive
Systems Engineering
Optical Devices
Optical Coatings
Engineering Management
Cross Functional Team Leadership
Failure Analysis
R&D
Manufacturing
Thin Films
Testing
Product Engineering
Product Management
Research and Development

Us Patents

Setting An Operating Bias Current For A Magnetoresistive Head By Computing A Target Operating Voltage
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US Patent:

7872824, Jan 18, 2011
Filed:

Jun 11, 2007
Appl. No.:

11/761266
Inventors:

Curtis V. Macchioni - Livermore CA, US
Jonas A. Goode - Lake Forest CA, US
Matthew R. Gibbons - San Jose CA, US
Tao Pan - San Jose CA, US
Andrei F. Khapikov - Santa Clara CA, US
Assignee:

Western Digital (Fremont), LLC - Fremont CA
International Classification:

G11B 5/03
US Classification:

360 66
Abstract:

A disk drive is disclosed having a disk, and a head actuated over the disk, the head comprising a magnetoresistive (MR) element. Control circuitry within the disk drive sets an operating bias current for the MR element by computing a target voltage for the MR element, applying a bias current to the MR element, measuring a voltage across the MR element corresponding to the bias current, and adjusting the bias current applied to the MR element until the measured voltage substantially equals the target voltage.

Method For Providing And Utilizing An Electronic Lapping Guide In A Magnetic Recording Transducer
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US Patent:

8151441, Apr 10, 2012
Filed:

Mar 27, 2008
Appl. No.:

12/056409
Inventors:

Steven C. Rudy - San Jose CA, US
Matthew R. Gibbons - San Jose CA, US
Curtis V. Macchioni - Livermore CA, US
Yun-Fei Li - Fremont CA, US
Changhe Shang - Fremont CA, US
Carlos Corona - Plesanton CA, US
Assignee:

Western Digital (Fremont), LLC - Fremont CA
International Classification:

G11B 5/455
G11B 5/187
US Classification:

2960309, 296031, 2960312, 2960316, 451 5, 324716
Abstract:

A method for providing an electronic lapping guide (ELG) for a structure in a magnetic transducer are described. The structure has a front edge and a back edge. The ELG includes a stripe having a top edge and a bottom edge. The method includes calibrating a sheet resistance of the stripe and calibrating an offset of the top edge of the stripe from the back edge of the structure. The method further includes terminating the lapping based at least on the sheet resistance and offset of the ELG.

Apparatus And Method Of Device Stripe Height Control
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US Patent:

61935840, Feb 27, 2001
Filed:

May 27, 1999
Appl. No.:

9/321486
Inventors:

Steven C. Rudy - San Jose CA
Curtis V. Macchioni - Livermore CA
Yong Shen - Tai Po, Nt, HK
Billy W. Crue - San Jose CA
Michael T. Harnischfeger - Union City CA
Steven J. Plewes - San Jose CA
Assignee:

Read-Rite Corporation - Milpitas CA
International Classification:

B24B 100
US Classification:

451 5
Abstract:

A lapping guide for use in fabrication of a device includes a first resistive element and a second resistive element. The two resistive elements can provide different changing resistances throughout the lapping of the device. These two resistances can be used throughout the lapping of the device to facilitate determination of when a predetermined desired height of the device has been achieved, and therefore stop the lapping of the device. The resistive elements can be physically adjacent to each other or separate from each other. Further, a common lead can be electrically connected to both resistive elements for measuring their respective resistances. In addition, the resistive elements can be separated from each other by the device.

Curtis V Macchioni