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Curtis V Macchioni

age ~69

from Livermore, CA

Also known as:
  • Curtis Vincent Macchioni
  • Curtis V Macchini
  • Curt V Macchioni
  • Curtis O
Phone and address:
2374 Merlot Ln, Livermore, CA 94550
(925)2451109

Curtis Macchioni Phones & Addresses

  • 2374 Merlot Ln, Livermore, CA 94550 • (925)2451109 • (925)3736217
  • 4173 Caminito Davila, San Diego, CA 92122
  • Fremont, CA
  • La Jolla, CA
  • Albuquerque, NM
  • 2374 Merlot Ln, Livermore, CA 94550 • (530)8630314

Work

  • Company:
    Western digital
    Feb 1, 2014 to Dec 2016
  • Position:
    Senior director of manufacturing engineering

Education

  • School / High School:
    Carnegie Mellon University
    1976 to 1983
  • Specialities:
    Physics, Philosophy

Skills

Program Management • Technology Product Development • Manufacturing Engineering • Product Development • Technology Transfer • Design of Experiments • Magnetic Recording • Disk Drive • Systems Engineering • Optical Devices • Optical Coatings • Engineering Management • Cross Functional Team Leadership • Failure Analysis • R&D • Manufacturing • Thin Films • Testing • Product Engineering • Product Management • Research and Development

Industries

Computer Hardware

Resumes

Curtis Macchioni Photo 1

Senior Director Wafer Integration, Test, Failure Analysis, Yield And Quality

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Location:
3911 Dartmouth Way, Livermore, CA 94550
Industry:
Computer Hardware
Work:
Western Digital Feb 1, 2014 - Dec 2016
Senior Director of Manufacturing Engineering

Western Digital Feb 1, 2014 - Dec 2016
Senior Director Wafer Integration, Test, Failure Analysis, Yield and Quality

Western Digital Jan 2005 - Dec 2014
Director of Advanced Programs Management

Lockheed Martin Jun 1, 2003 - Jan 1, 2005
Senior Principal Systems Engineer

Wavesplitter Technologies 2000 - 2003
Manufacturing Engineering Manager
Education:
Carnegie Mellon University 1976 - 1983
Carnegie Mellon University 1972 - 1976
Bachelors, Bachelor of Science, Physics
Skills:
Program Management
Technology Product Development
Manufacturing Engineering
Product Development
Technology Transfer
Design of Experiments
Magnetic Recording
Disk Drive
Systems Engineering
Optical Devices
Optical Coatings
Engineering Management
Cross Functional Team Leadership
Failure Analysis
R&D
Manufacturing
Thin Films
Testing
Product Engineering
Product Management
Research and Development

Us Patents

  • Setting An Operating Bias Current For A Magnetoresistive Head By Computing A Target Operating Voltage

    view source
  • US Patent:
    7872824, Jan 18, 2011
  • Filed:
    Jun 11, 2007
  • Appl. No.:
    11/761266
  • Inventors:
    Curtis V. Macchioni - Livermore CA, US
    Jonas A. Goode - Lake Forest CA, US
    Matthew R. Gibbons - San Jose CA, US
    Tao Pan - San Jose CA, US
    Andrei F. Khapikov - Santa Clara CA, US
  • Assignee:
    Western Digital (Fremont), LLC - Fremont CA
  • International Classification:
    G11B 5/03
  • US Classification:
    360 66
  • Abstract:
    A disk drive is disclosed having a disk, and a head actuated over the disk, the head comprising a magnetoresistive (MR) element. Control circuitry within the disk drive sets an operating bias current for the MR element by computing a target voltage for the MR element, applying a bias current to the MR element, measuring a voltage across the MR element corresponding to the bias current, and adjusting the bias current applied to the MR element until the measured voltage substantially equals the target voltage.
  • Method For Providing And Utilizing An Electronic Lapping Guide In A Magnetic Recording Transducer

    view source
  • US Patent:
    8151441, Apr 10, 2012
  • Filed:
    Mar 27, 2008
  • Appl. No.:
    12/056409
  • Inventors:
    Steven C. Rudy - San Jose CA, US
    Matthew R. Gibbons - San Jose CA, US
    Curtis V. Macchioni - Livermore CA, US
    Yun-Fei Li - Fremont CA, US
    Changhe Shang - Fremont CA, US
    Carlos Corona - Plesanton CA, US
  • Assignee:
    Western Digital (Fremont), LLC - Fremont CA
  • International Classification:
    G11B 5/455
    G11B 5/187
  • US Classification:
    2960309, 296031, 2960312, 2960316, 451 5, 324716
  • Abstract:
    A method for providing an electronic lapping guide (ELG) for a structure in a magnetic transducer are described. The structure has a front edge and a back edge. The ELG includes a stripe having a top edge and a bottom edge. The method includes calibrating a sheet resistance of the stripe and calibrating an offset of the top edge of the stripe from the back edge of the structure. The method further includes terminating the lapping based at least on the sheet resistance and offset of the ELG.
  • Apparatus And Method Of Device Stripe Height Control

    view source
  • US Patent:
    61935840, Feb 27, 2001
  • Filed:
    May 27, 1999
  • Appl. No.:
    9/321486
  • Inventors:
    Steven C. Rudy - San Jose CA
    Curtis V. Macchioni - Livermore CA
    Yong Shen - Tai Po, Nt, HK
    Billy W. Crue - San Jose CA
    Michael T. Harnischfeger - Union City CA
    Steven J. Plewes - San Jose CA
  • Assignee:
    Read-Rite Corporation - Milpitas CA
  • International Classification:
    B24B 100
  • US Classification:
    451 5
  • Abstract:
    A lapping guide for use in fabrication of a device includes a first resistive element and a second resistive element. The two resistive elements can provide different changing resistances throughout the lapping of the device. These two resistances can be used throughout the lapping of the device to facilitate determination of when a predetermined desired height of the device has been achieved, and therefore stop the lapping of the device. The resistive elements can be physically adjacent to each other or separate from each other. Further, a common lead can be electrically connected to both resistive elements for measuring their respective resistances. In addition, the resistive elements can be separated from each other by the device.

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