Daniel Lee Pasco

US Patent:

20080191934, Aug 14, 2008

Filed:

Apr 18, 2008

Appl. No.:

12/106031

Inventors:

James W. Baker - Seattle WA, US
Daniel L. Pasco - Seattle WA, US
Roger D. Percy - Seattle WA, US
R. Cameron Percy - Seattle WA, US
Kay S. Burke - Seattle WA, US

International Classification:

G01S 1/00
H04B 7/185

US Classification:

34235701, 342451

Abstract:

Methods and apparatus for crediting media exposure are disclosed. An example method includes processing data representative of locations recorded by an electronic device to enhance at least one of completeness or accuracy of the data, deriving position fixes from the processed data, and modifying via a decision tree at least one of the derived position fixes to align with a known course of travel.

US Patent:

20080243573, Oct 2, 2008

Filed:

May 8, 2008

Appl. No.:

12/117181

Inventors:

Kamal Nasser - Palm Harbor FL, US
Peter Campbell Doe - Ridgewood NJ, US
Wendy Malley - Hoffman Estates IL, US
Lorraine Hadfield - Pennington NJ, US
James W. Baker - Seattle WA, US
Daniel L. Pasco - Seattle WA, US
Roger D. Percy - Seattle WA, US
R. Cameron Percy - Seattle WA, US
Kay S. Burke - Seattle WA, US

International Classification:

G06Q 10/00

US Classification:

705 7

Abstract:

Methods and apparatus for crediting media exposure are disclosed. An example method includes deriving a plurality of travel paths traversed by respective ones of a plurality of respondents, determining, via a first technique, exposures of the respective ones of the plurality of respondents to a plurality of media sites based on the derived plurality of travel paths, and modifying the determined exposures to the plurality of media sites to improve a statistical accuracy of the modified determined exposures by constraining the determined exposures based on exposure information for the plurality of media sites obtained via a second technique different than the first technique.

US Patent:

20080133291, Jun 5, 2008

Filed:

Jan 30, 2007

Appl. No.:

11/668931

Inventors:

Kamal Nasser - Palm Harbor FL, US
Peter Campbell Doe - Ridgewood NJ, US
Wendy Malley - Hoffman Estates IL, US
Lorraine Hadfield - Pennington NJ, US
James W. Baker - Seattle WA, US
Daniel L. Pasco - Seattle WA, US
Roger D. Percy - Seattle WA, US
R. Cameron Percy - Seattle WA, US

International Classification:

G06F 17/30
G01C 21/02

US Classification:

705 7, 701213

Abstract:

Methods, systems, and computer program products for implementing product randomization and analysis in a manufacturing environment are provided. A method includes processing products for a plurality of lots, at process equipment, using a randomization technique for selecting each product in the lots. The method further including generating an operation identification record for each operation in the process recipe that includes mapping, for each operation, a slot identifier associated with a randomly selected product to a process variable identifier, a process tool, and the operation. The method also includes defining slot groupings using slot identifiers for a product carrier and identifying product yield patterns by analyzing historical yields for each of the slot groupings. The method also includes determining the frequency of occurrence of one or more product yield patterns for each operation in the process recipe by analyzing product yields from the operation identification records corresponding to the plurality of lots.