Daniel M Patterson

US Patent:

6465397, Oct 15, 2002

Filed:

Feb 11, 2000

Appl. No.:

09/502637

Inventors:

Daniel Bruce Patterson - Huntersville NC

Assignee:

Clariant Finance (BVI) Limited - Tortola

International Classification:

C09K 300

US Classification:

507222, 507225, 507226, 507227, 526240, 526287, 526278

Abstract:

What is disclosed is the preparation and use of synthetic water soluble copolymers useful in modifying the water permeability characteristics of subterranean hydrocarbon producing formations. The copolymers are in the form of dilute, pumpable, homogeneous, aqueous solutions and comprise a crosslinked synthetic copolymerizate with intramolecular and intermolecular crosslinking in a non-gelled state and a molecular size/shape corresponding to a K-value of 220-450.

US Patent:

57515883, May 12, 1998

Filed:

Jun 6, 1995

Appl. No.:

8/465689

Inventors:

Candace J. Freedenberg - Poughkeepsie NY
David C. Long - Wappingers Falls NY
Joshua M. Cobb - Millbrook NY
Mark J. LaPlante - Walden NY
Uldis A. Ziemins - Poughkeepsie NY
Daniel G. Patterson - Wappingers Falls NY
James G. Balz - Maybrook NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 1900
G06G 764
G06G 766

US Classification:

36447428

Abstract:

A desired design for electronic structures is converted into a graphic design format and sorted into a pseudo-raster format corresponding to scan lines. A laser or other machining beam is controlled by a separate tracking beam utilizing a mid-objective scanning system. The firing frequency of the machining beam is determined by the position of the tracking beam on a detector, as compared to the scan line data. Accuracy is verified by detection of plume or spectra generated during machining. Alignment of the machining and tracking beams is by interferometric methods. The system improves optical performance parameters of telecentricity, angle of scanned beam line, location of line in which the scanned line resides, astigmatism and field curvature.

US Patent:

D305550, Apr 4, 1989

Filed:

Jul 24, 1986

Appl. No.:

6/889071

Inventors:

Daniel J. Patterson - Hermitage TN

US Classification:

D23249

US Patent:

55417310, Jul 30, 1996

Filed:

May 18, 1995

Appl. No.:

8/444302

Inventors:

Candace J. Freedenberg - Poughkeepsie NY
David C. Long - Wappingers Falls NY
Joshua M. Cobb - Millbrook NY
Mark J. LaPlante - Walden NY
Uldis A. Ziemins - Poughkeepsie NY
Daniel G. Patterson - Wappingers Falls NY
James G. Balz - Maybrook NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01B 902

US Classification:

356345

Abstract:

A desired design for electronic structures is converted into a graphic design format and sorted into a pseudo-raster format corresponding to scan lines. A laser or other machining beam is controlled by a separate tracking beam utilizing a mid-objective scanning system. The firing frequency of the machining beam is determined by the position of the tracking beam on a detector, as compared to the scan line data. Accuracy is verified by detection of plume or spectra generated during machining. Evaluation and alignment of the machining and tracking beams is by interferometric methods. The system improves optical performance parameters of telecentricity, angle of scanned beam line, location of line in which the scanned line resides, astigmatism and field curvature.

US Patent:

56184549, Apr 8, 1997

Filed:

Jun 6, 1995

Appl. No.:

8/465978

Inventors:

Candace J. Freedenberg - Poughkeepsie NY
David C. Long - Wappingers Falls NY
Joshua M. Cobb - Millbrook NY
Mark J. LaPlante - Walden NY
Uldis A. Ziemins - Poughkeepsie NY
Daniel G. Patterson - Wappingers Falls NY
James G. Balz - Maybrook NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

B23K 2604

US Classification:

21912174

Abstract:

A desired design for electronic structures is converted into a graphic design format and sorted into a pseudo-raster format corresponding to scan lines. A laser or other machining beam is controlled by a separate tracking beam utilizing a mid-objective scanning system. The firing frequency of the machining beam is determined by the position of the tracking beam on a detector, as compared to the scan line data. Accuracy is verified by detection of plume or spectra generated during machining. Alignment of the machining and tracking beams is by interferometric methods. The system improves optical performance parameters of telecentricity, angle of scanned beam line, location of line in which the scanned line resides, astigmatism and field curvature.

US Patent:

56267789, May 6, 1997

Filed:

Jun 6, 1995

Appl. No.:

8/465688

Inventors:

Candace J. Freedenberg - Poughkeepsie NY
David C. Long - Wappingers Falls NY
Joshua M. Cobb - Millbrook NY
Mark J. LaPlante - Walden NY
Uldis A. Ziemins - Poughkeepsie NY
Daniel G. Patterson - Wappingers Falls NY
James G. Balz - Maybrook NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

B23K 2604

US Classification:

21912174

Abstract:

A desired design for electronic structures is converted into a graphic design format and sorted into a pseudo-raster format corresponding to scan lines. A laser or other machining beam is controlled by a separate tracking beam utilizing a mid-objective scanning system. The firing frequency of the machining beam is determined by the position of the tracking beam on a detector, as compared to the scan line data. Accuracy is verified by detection of plume or spectra generated during machining. Alignment of the machining and tracking beams is by interferometric methods. The system improves optical performance parameters of telecentricity, angle of scanned beam line, location of line in which the scanned line resides, astigmatism and field curvature.

US Patent:

56206186, Apr 15, 1997

Filed:

Apr 28, 1995

Appl. No.:

8/430480

Inventors:

Candace J. Freedenberg - Poughkeepsie NY
David C. Long - Wappingers Falls NY
Joshua M. Cobb - Millbrook NY
Mark J. LaPlante - Walden NY
Uldis A. Ziemins - Poughkeepsie NY
Daniel G. Patterson - Wappingers Falls NY
James G. Balz - Maybrook NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

B23K 2608

US Classification:

21912174

Abstract:

A desired design for electronic structures is converted into a graphic design format and sorted into a pseudo-raster format corresponding to scan lines. A laser or other machining beam is controlled by a separate tracking beam utilizing a mid-objective scanning system. The firing frequency of the machining beam is determined by the position of the tracking beam on a detector, as compared to the scan line data. Accuracy is verified by detection of plume or spectra generated during machining. Alignment of the machining and tracking beams is by interferometric methods. The system improves optical performance parameters of telecentricity, angle of scanned beam line, location of line in which the scanned line resides, astigmatism and field curvature.