Daniel C Proskauer

US Patent:

56732724, Sep 30, 1997

Filed:

Feb 13, 1996

Appl. No.:

8/600837

Inventors:

Daniel C. Proskauer - Newton MA
Mogens Ravn - Winchester MA
Kevin G. Hood - Waltham MA
Thomas G. Amann - Canton MA
Thomas B. Westbom - Wayland MA

Assignee:

Teradyne, Inc. - Boston MA

International Classification:

G01R 3128

US Classification:

371 221

Abstract:

An electronic circuit tester for performing digital signal processing on signals generated by an electronic circuit including a multi-processor test computer, a plurality of driver/receiver channels, a plurality of capture instruments, and a plurality of high speed data paths. Capture instruments are programmed by the tester to sample a signal generated by an electronic circuit under test, convert the samples to digital form if necessary, and store the data samples in memory. The data samples are then moved from the memory of the capture instruments to the main memory of the multi-processor for analysis using digital signal processing techniques. After the initial group of data samples are moved from the capture instruments to main memory, subsequent programming of capture instruments and sampling of signals are performed concurrently with the movement and analysis of data samples. Multiple processors and multiple high speed data paths are preferably used to optimize test program throughput.

US Patent:

58286748, Oct 27, 1998

Filed:

Sep 16, 1997

Appl. No.:

8/931793

Inventors:

Daniel C. Proskauer - Newton MA

Assignee:

Teradyne, Inc. - Boston MA

International Classification:

G06F 1100

US Classification:

371 221

Abstract:

A production operator interface is created using self-contained ActiveX controls each of which provide an interface to a specific part of the overall test system. These controls all communicate among themselves automatically. The production interface uses an ActiveX "tester control" which provides an application programming interface to the rest of the software control system. A library of self-contained ActiveX controls is provided which contains "operator controls" which may be "dragged and dropped" into an operator window to provide the operator with information and the ability to control the test system. In addition a semiconductor test system needs to be adapted to work with one or more different packaged device handlers or wafer probers which position a semiconductor device for testing by the tester. An ActiveX operator control allows an operator to select a handler driver from a library of handler drivers.

US Patent:

59387815, Aug 17, 1999

Filed:

Oct 13, 1998

Appl. No.:

9/170490

Inventors:

Daniel C. Proskauer - Newton MA

Assignee:

Teradyne, Inc. - Boston MA

International Classification:

G06F 1100

US Classification:

714724

Abstract:

A production operator interface is created using self-contained ActiveX controls each of which provide an interface to a specific part of the overall test system. These controls all communicate among themselves automatically. The production interface uses an ActiveX "tester control" which provides an application programming interface to the rest of the software control system. A library of self-contained ActiveX controls is provided which contains "operator controls" which may be "dragged and dropped" into an operator window to provide the operator with information and the ability to control the test system. In addition a semiconductor test system needs to be adapted to work with one or more different packaged device handlers or wafer probers which position a semiconductor device for testing by the tester. An ActiveX operator control allows an operator to select a handler driver from a library of handler drivers.