Daniel J Swanson

US Patent:

20190279835, Sep 12, 2019

Filed:

May 20, 2019

Appl. No.:

16/416423

Inventors:

- MONONA WI, US
Evan R. Sengbusch - Verona WI, US
Ross F. Radel - Madison WI, US
Arne V. Kobernik - Madison WI, US
Tye T. Gribb - Fitchburg WI, US
Preston J. Barrows - Madison WI, US
Christopher M. Seyfert - Ridgeway WI, US
Logan D. Campbell - Madison WI, US
Daniel J. Swanson - Madison WI, US
Eric D. Risley - Middleton WI, US
Jin W. Lee - Madison WI, US
Kevin D. Meaney - Green Bay WI, US

International Classification:

H01J 27/02
H01J 37/08
H01J 27/18
H01J 27/16
H01J 27/22

Abstract:

A negative ion source includes a plasma chamber, a microwave source, a negative ion converter, a magnetic filter and a beam formation mechanism. The plasma chamber contains gas to be ionized. The microwave source transmits microwaves to the plasma chamber to ionize the gas into atomic species including hyperthermal neutral atoms. The negative ion converter converts the hyperthermal neutral atoms to negative ions. The magnetic filter reduces a temperature of an electron density provided between the plasma chamber and the negative ion converter. The beam formation mechanism extract the negative ions.

US Patent:

20180122615, May 3, 2018

Filed:

Dec 19, 2017

Appl. No.:

15/846752

Inventors:

- Monona WI, US
Evan R. Sengbusch - Verona WI, US
Ross F. Radel - Madison WI, US
Arne V. Kobernik - Madison WI, US
Tye T. Gribb - Fitchburg WI, US
Preston J. Barrows - Madison WI, US
Christopher M. Seyfert - Ridgeway WI, US
Logan D. Campbell - Madison WI, US
Daniel J. Swanson - Madison WI, US
Eric D. Risley - Middleton WI, US
Jin W. Lee - Madison WI, US
Kevin D. Meaney - Green Bay WI, US

International Classification:

H01J 27/02
H01J 37/08
H01J 27/22
H01J 27/16
H01J 27/18

Abstract:

A negative ion source includes a plasma chamber, a microwave source, a negative ion converter, a magnetic filter and a beam formation mechanism. The plasma chamber contains gas to be ionized. The microwave source transmits microwaves to the plasma chamber to ionize the gas into atomic species including hyperthermal neutral atoms. The negative ion converter converts the hyperthermal neutral atoms to negative ions. The magnetic filter reduces a temperature of an electron density provided between the plasma chamber and the negative ion converter. The beam formation mechanism extract the negative ions.

US Patent:

20160163495, Jun 9, 2016

Filed:

Jun 26, 2014

Appl. No.:

14/903747

Inventors:

- Monona WI, US
Evan R. Sengbusch - Verona WI, US
Ross F. Radel - Madison WI, US
Arne V. Kobernik - Madison WI, US
Tye T. Gribb - Fitchburg WI, US
Preston J. Barrows - Madison WI, US
Christopher M. Seyfert - Ridgeway WI, US
Logan D. Campbell - Madison WI, US
Daniel J. Swanson - Madison WI, US
Eric D. Risley - Middleton WI, US
Jin W. Lee - Madison WI, US
Kevin D. Meaney - Green Bay WI, US

Assignee:

Phoenix Nuclear Labs LLC - Monona WI

International Classification:

H01J 27/02
H01J 27/22
H01J 27/16

Abstract:

A negative ion source includes a plasma chamber, a microwave source, a negative ion converter, a magnetic filter and a beam formation mechanism. The plasma chamber contains gas to be ionized. The microwave source transmits microwaves to the plasma chamber to ionize the gas into atomic species including hyperthermal neutral atoms. The negative ion converter converts the hyperthermal neutral atoms to negative ions. The magnetic filter reduces a temperature of electrons provided between the plasma chamber and the negative ion converter. The beam formation mechanism extracts the negative ions.