Darrell J Long

US Patent:

6365681, Apr 2, 2002

Filed:

Jan 16, 2001

Appl. No.:

09/761039

Inventors:

Ivan Jeremy Hartley - St. Albans WV
John Roberts Parrish - Cross Lanes WV
Paul Kevin Samples - Scott Depot WV
Darrell James Long - Destrehan LA

Assignee:

Union Carbide Chemicals Plastics Technology Corporation - Danburry CT

International Classification:

C08F 240

US Classification:

526 61, 526 59, 526 82, 526 84, 526901

Abstract:

In a polymerization reaction, an upset is anticipated and inhibited by monitoring at least one reaction condition and comparing it to the desired value or normal range for the condition as projected by a computer model for the variable or variables of the process. In a preferred variation, the process not only continuously adjusts the set point or range for an upset-significant variable such as temperature, but also utilizes the rate of change of such a variable as a harbinger of an upset.

US Patent:

20210002114, Jan 7, 2021

Filed:

Jun 29, 2020

Appl. No.:

16/915611

Inventors:

- Fairview OR, US
Darrell Long - Greenville NC, US

Assignee:

Hyster-Yale Group, Inc. - Fairview OR

International Classification:

B66F 9/24
G08B 21/18

Abstract:

A system for a pallet truck load wheel mechanism comprises a logic device and first and second sensor arrangements. The first and second sensor arrangements include first and second sensing fields that define first and second edges of an operability window, respectively. The logic device has an operable state indicating that the load wheel mechanism can raise a pallet lifting device and an inoperable state indicating that the load wheel mechanism should not raise the pallet lifting device. The logic device is initialized in the operable state and is configured to change to the inoperable state in response to each time the first sensor arrangement detects an edge of a board intersecting, the first edge of the operability window and to change to the operable state in response to each time the second sensor arrangement detects an edge of a board intersecting the second edge of the operability window.