Dow Corning Feb 2011 - Jan 2015
S and T Process Development Manager
Dow Corning Feb 2011 - Jan 2015
Conductive Materials Technology Leader
Dow Corning Nov 2003 - Jan 2011
Sic Crystal Growth Engineer
Alfalight May 2001 - Nov 2003
Epitaxial Growth Engineering
Education:
University of Wisconsin - Madison 1995 - 2001
Doctorates, Doctor of Philosophy, Chemical Engineering
University of Michigan 1991 - 1995
Bachelors, Bachelor of Science, Chemical Engineering, Engineering
Skills:
Design of Experiments Materials Science Process Engineering Process Simulation R&D Semiconductors Chemical Engineering Characterization Product Development Manufacturing Thin Films Cvd Polymers Coatings Engineering Spc Deposition and Growth Research and Development Metrology Jmp Statistical Process Control
Luke Mawst - Sun Prairie WI, US Nelson Tansu - Madison WI, US Michael Nesnidal - Oregon WI, US Steven Meassick - Mt. Horeb WI, US Eric Stiers - LaCrosse WI, US Darren Hansen - Madison WI, US Troy Goodnough - Madison WI, US
International Classification:
H01S005/00
US Classification:
372/045000
Abstract:
An edge-emitting semiconductor laser incorporating a narrow waveguide design is disclosed. The narrow waveguide expands the lateral mode size, creates a large modal spot size, and insures higher-order modes are beyond cutoff. Separate current confinement allows the current injection region to match the mode size. The resulting device exhibits single-mode operation with a large spot-size to high output powers.
- Midland MI, US - Collegeville PA, US Darren Hansen - Auburn MI, US
International Classification:
C08L 83/04 C08J 3/22
Abstract:
A composition contains the following components: (a) 15 to 49.8 volume-percent of a first polysiloxane that is has a viscosity in a range of 50 centiStokes to 550 Stokes as determined according to ASTM D4283-98; (b) 0.2 to 5 volume-percent of an organoclay; (c) 50-74 volume-percent roundish or crushed thermally conductive fillers including: (i) 5 to 15 volume-percent small thermally conductive fillers having a median particle size in a range of 0.1 to 1.0 micrometers; (ii) 10 to 25 volume-percent medium thermally conductive fillers having a median particle size in a range of 1.1 to 5.0 micrometers; (iii) 25 to 50 volume-percent large thermally conductive fillers having a median particle size in a range of 5.1 to 50 micrometers; and (d) 0 to 5 volume-percent of an alkoxy functional linear polysiloxane different from the first polysiloxane and/or an alkoxy functional linear silane; where volume-percent values are relative to composition volume.
Thermally Conductive Composition Containing Mgo Filler And Methods And Devices In Which Said Composition Is Used
- Midland MI, US Yan Zheng - Shanghai, CN Hongyu Chen - Shanghai, CN Chen Chen - Shanghai, CN Dorab Bhagwagar - Saginaw MI, US Darren Hansen - Auburn MI, US
International Classification:
C08L 83/00 C08K 3/22 C08K 5/3417
Abstract:
A highly thermally conductive composition is provided, such composition comprising: (A) An organopolysiloxane composition; (B) a filler treating agent; (C) a thermal stabilizer; and (D) thermally conductive filler mixture, comprising: (D-1) a small-particulate thermally conductive filler having a mean size of up to 1 μm, (D-2) middle-sized filler having a mean size of from 1 to 10 μm, (D-3) large filler having a mean size of larger than 30 μm and comprising at least magnesium oxide.
Thermally Conductive Composition And Methods And Devices In Which Said Composition Is Used
A highly thermally conductive composition is provided, such composition comprising: (A) An organopolysiloxane composition; (B) a filler treating agent; (C) a thermal stabilizer; and (D) thermally conductive filler mixture, comprising: (D-1) a small-particulate thermally conductive filler having a mean size of up to 3 μm, (D-2) spherical aluminum nitride having a mean size of from 50 to 150 μm, (D-3) boron nitride having a mean size of from 20 to 200 μm.
Sic Crystal And Wafer Cut From Crystal With Low Dislocation Density
A method of forming an SiC crystal including placing in an insulated graphite container a seed crystal of SiC, and supporting the seed crystal on a shelf, wherein cushion rings contact the seed crystal on a periphery of top and bottom surfaces of the seed crystal, and where the graphite container does not contact a side surface of the seed crystal; placing a source of Si and C atoms in the insulated graphite container, where the source of Si and C atoms is for transport to the seed crystal to grow the SiC crystal; placing the graphite container in a furnace; heating the furnace; evacuating the furnace; filling the furnace with an inert gas; and maintaining the furnace to support crystal growth to thereby form the SiC crystal.
Sic Crystal And Wafer Cut From Crystal With Low Dislocation Density
- Midland MI, US Roman Drachev - Midland MI, US Darren Hansen - Midland MI, US Edward Sanchez - Midland MI, US
Assignee:
Dow Corning Corporation - Midland MI
International Classification:
C30B 23/02 C30B 29/36 C30B 23/06
US Classification:
428131, 117109, 118726, 423345
Abstract:
A method of forming an SiC crystal including placing in an insulated graphite container a seed crystal of SiC, and supporting the seed crystal on a shelf, wherein cushion rings contact the seed crystal on a periphery of top and bottom surfaces of the seed crystal, and where the graphite container does not contact a side surface of the seed crystal; placing a source of Si and C atoms in the insulated graphite container, where the source of Si and C atoms is for transport to the seed crystal to grow the SiC crystal; placing the graphite container in a furnace; heating the furnace; evacuating the furnace; filling the furnace with an inert gas; and maintaining the furnace to support crystal growth to thereby form the SiC crystal.