David Patrick Crook
age ~48
from Loveland, CO
- Also known as:
-
- David P Crook
- Phone and address:
-
6382 Sea Gull Cir, Loveland, CO 80538
(970)9888125
David Crook Phones & Addresses
- 6382 Sea Gull Cir, Loveland, CO 80538 • (970)9888125
- Fort Collins, CO
- Folsom, CA
- Rancho Cordova, CA
- Waterloo, IL
- Champaign, IL
Work
-
Position:Professional/Technical
Specialities
Land Use & Zoning • Real Estate • Zoning Law • Estate Planning
Isbn (Books And Publications)
The Wall Street Journal. Complete Real Estate Investing Guidebook
view sourceAuthor
David Crook
ISBN #
0307345629
Orlando Di Lasso's Imitation Magnificats for Counter-Reformation Munich
view sourceAuthor
David Crook
ISBN #
0691036144
Education and Employment: The Dfee and Its Place in History
view sourceAuthor
David Crook
ISBN #
0854736050
History, Politics and Policy-making: A Festschrift Presented to Richard Aldrich
view sourceAuthor
David Crook
ISBN #
0854737863
Medicine Doctors
David E. Crook
view sourceSpecialties:
Anesthesiology
Work:
Northside Anesthesia ServicesNorthside Anesthesia Services LLC
13500 N Meridian St, Carmel, IN 46032
(317)5672180 (phone), (800)7310751 (fax)
Northside Anesthesia ServicesNorthside Anesthesia Services LLC
2001 W 86 St, Indianapolis, IN 46260
(317)5661000 (phone), (317)5661700 (fax)
Northside Anesthesia ServicesNorthside Anesthesia Services LLC
13421 Old Meridian St STE 100, Carmel, IN 46032
(317)7061600 (phone), (317)7061601 (fax)
Northside Anesthesia Services
8501 Harcourt Rd, Indianapolis, IN 46260
(317)5672179 (phone), (317)4714441 (fax)
Northside Anesthesia ServicesNorthside Anesthesia Services LLC
8111 Township Line Rd, Indianapolis, IN 46260
(317)7055050 (phone), (800)7310751 (fax)
13500 N Meridian St, Carmel, IN 46032
(317)5672180 (phone), (800)7310751 (fax)
Northside Anesthesia ServicesNorthside Anesthesia Services LLC
2001 W 86 St, Indianapolis, IN 46260
(317)5661000 (phone), (317)5661700 (fax)
Northside Anesthesia ServicesNorthside Anesthesia Services LLC
13421 Old Meridian St STE 100, Carmel, IN 46032
(317)7061600 (phone), (317)7061601 (fax)
Northside Anesthesia Services
8501 Harcourt Rd, Indianapolis, IN 46260
(317)5672179 (phone), (317)4714441 (fax)
Northside Anesthesia ServicesNorthside Anesthesia Services LLC
8111 Township Line Rd, Indianapolis, IN 46260
(317)7055050 (phone), (800)7310751 (fax)
Education:
Medical School
Indiana University School of Medicine
Graduated: 2000
Indiana University School of Medicine
Graduated: 2000
Conditions:
Abnormal Vaginal Bleeding
Languages:
English
Description:
Dr. Crook graduated from the Indiana University School of Medicine in 2000. He works in Carmel, IN and 4 other locations and specializes in Anesthesiology. Dr. Crook is affiliated with Saint Vincent Womens Hospital, St Vincent Carmel Hospital and St Vincent Indianapolis Hospital & Heart Center.
Amazon
Pursuit of Passy
view sourceA thrilling novel of a man hunt with a nation's existence at stake.Peter Claydon is an R.A.F pilot during The Battle of Britain. Fate leads him on a mission to pursue a traitor in occupied France.David Moore Crook DFC (24 November 1914 — 18 December 1944) was a British fighter pilot born in Huddersf...
Author
David Moore Crook
Binding
Kindle Edition
Pages
197
Publisher
S J Crook
ISBN #
8
The Growth of Royal Government under Henry III
view sourceThe thirteenth century saw major developments in England's administration, as the procedures and processes of government expanded rapidly, The principles enshrined in Magna Carta became embedded, knights and burgesses were summoned to Parliament for the first time, and nothing short of a political r...
Binding
Hardcover
Pages
224
Publisher
Boydell Press
ISBN #
1783270675
EAN Code
9781783270675
ISBN #
7
Civilization Under Attack : September 11, 2001 & Beyond
view sourceMaking Sense of the Events That Changed Our World "Our book takes the one factor that is starkly and clearly known-the exact time of the September 11 attack-and applies the one science that can analyze time to bring understanding about the antecedents of the event, about the people involved in car...
Author
Stephanie J. Clement, Bernie Ashman, David Crook, Robert Hand, Jonathan Keyes, Kris Brandt Riske, Georgia Anna Stathis
Binding
Paperback
Pages
264
Publisher
Llewellyn Publications
ISBN #
0738702471
EAN Code
9780738702476
ISBN #
6
Spitfire Pilot: A Personal Account of the Battle of Britain
view source1939. The battle for the skies of Britain has just begun.At the outbreak of the Second World War D. M. Crook, of No. 609 Squadron AAF, was at Yeadon, still undergoing his training; by the winter of 1939-40, he had his wings.Successfully applying to return to his Squadron, then on defence duties in n...
Author
Flight Lieutenant David Crook DFC
Binding
Kindle Edition
Pages
94
Publisher
Albion Press
ISBN #
2
The Routledge International Encyclopedia of Education
view sourceThe Routledge International Encyclopedia of Education is a unique and major resource for the field of education. It is a comprehensive, single-volume work, arranged alphabetically and comprising around 600 entries. The entries range from definitions of key educational concepts and terms to biographi...
Binding
Paperback
Pages
760
Publisher
Routledge
ISBN #
0415749239
EAN Code
9780415749237
ISBN #
5
The Wall Street Journal. Complete Home Owner's Guidebook: Make the Most of Your Biggest Asset in Any Market
view sourceYour Map for a Brave New Real-Estate WorldThe days of real-estate mania—when you really couldn’t go wrong with buying a home, then selling it in a few years for a lot more than you paid for it—are over. Inflated prices and the “subprime” mortgage crisis have finally burst the bubble. Now, more than ...
Author
David Crook
Binding
Paperback
Pages
272
Publisher
Crown Business
ISBN #
0307405923
EAN Code
9780307405920
ISBN #
3
The Wall Street Journal. Complete Real-Estate Investing Guidebook
view sourceThe conservative, thoughtful, thrifty investor’s guide to building a real-estate empire.Profitable real-estate investing opportunities exist everywhere as long as you know what to look for and understand how to make prudent deals that transform property into profits. David Crook, of The Wall Street ...
Author
David Crook
Binding
Paperback
Pages
256
Publisher
Crown Business
ISBN #
0307345629
EAN Code
9780307345622
ISBN #
1
Name / Title
Company / Classification
Phones & Addresses
Owner
Photo Assure
Photofinishing Laboratory
Photofinishing Laboratory
2331 Abeyta Ct, Loveland, CO 80538
LIGHTING + ENERGY SAVINGS SOLUTIONS LLC
Professional Engineer
Hach
Environmental Services · Manufactures water testing instruments and chemicals · Mfg Analytical Instr Mfg Process Cntrl Instr · Nonclassifiable Establishments · Analytical Instruments · Products of Purchased Glass
Environmental Services · Manufactures water testing instruments and chemicals · Mfg Analytical Instr Mfg Process Cntrl Instr · Nonclassifiable Establishments · Analytical Instruments · Products of Purchased Glass
5600 Lindbergh Dr, Loveland, CO 80539
6095 Parkland Blvd STE 310, Cleveland, OH 44124
PO Box 389, Loveland, CO 80539
5400 Big Tyler Rd, Charleston, WV 25313
(970)6631377, (970)6693050, (970)6692932, (800)2274224
6095 Parkland Blvd STE 310, Cleveland, OH 44124
PO Box 389, Loveland, CO 80539
5400 Big Tyler Rd, Charleston, WV 25313
(970)6631377, (970)6693050, (970)6692932, (800)2274224
Lawyers & Attorneys
David Crook - Lawyer
view sourceOffice:
Law Office of David W. Crook
Specialties:
Land Use & Zoning
Real Estate
Zoning Law
Estate Planning
Real Estate
Zoning Law
Estate Planning
ISLN:
908108419
Admitted:
1982
University:
Fairleigh Dickinson University, B.A.
Law School:
Seton Hall University, J.D.
Us Patents
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Method And Apparatus For Adaptively Learning Test Measurement Delays On An Individual Device Test For Reducing Total Device Test Time
view source -
US Patent:6377901, Apr 23, 2002
-
Filed:Mar 1, 1999
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Appl. No.:09/259866
-
Inventors:Steven K List - Loveland CO
David T. Crook - Loveland CO -
Assignee:Agilent Technologies, Inc. - Palo Alto CA
-
International Classification:G01R 3114
-
US Classification:702119, 702 79, 702117, 702123
-
Abstract:An adaptive delay learning algorithm is presented that reduces the amount of delay before making test measurements in an automated test that requires a delay of any type to be completed before a measurement is made in order to remove the possibility that a tester component lying in the measurement path has not achieved a ready state. In the execution of an automated test, a current delay time is set to an initial delay value. Test execution does not begin until the current delay time elapses. If, upon execution, the test fails, the current delay time is set to a different delay time, and the test is reexecuted only after the updated current delay time has elapsed.
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Multiple Axis Magnetic Test For Open Integrated Circuit Pins
view source -
US Patent:6529019, Mar 4, 2003
-
Filed:Oct 23, 2000
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Appl. No.:09/694600
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Inventors:Philip N King - Ft Collins CO
David T Crook - Loveland CO
John Elliott McDermid - Loveland CO -
Assignee:Agilent Technologies, Inc. - Palo Alto CA
-
International Classification:G01R 3126
-
US Classification:324750
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Abstract:The present disclosure relates to a method and apparatus for determining the electrical continuity of an element of an electrical component, for example, a pin of a printed circuit assembly. The method comprises the steps of supplying an electrical stimulus to the element of the electrical component, positioning a sensor adjacent the element of the electrical component, the sensor having multiple axes along which the sensor is responsive to magnetic fields, receiving magnetic field signals created by the element of the electrical component with the sensor, producing electrical signals indicative of the magnetic field strength sensed by the sensor in multiple directions that correspond to the multiple axes, and comparing the electrical signals with predetermined limits associated with the element being tested. In a preferred arrangement, the sensor is provided with three axes which are oriented in orthogonal directions such that the magnetic signals from the element can be detected in three dimensional space.
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Method And Apparatus For Configurable Hardware Augmented Program Generation
view source -
US Patent:6636061, Oct 21, 2003
-
Filed:Jul 10, 2002
-
Appl. No.:10/192260
-
Inventors:David T Crook - Loveland CO
John Elliott McDermid - Loveland CO -
Assignee:Agilent Technologies, Inc. - Palo Alto CA
-
International Classification:G01R 3102
-
US Classification:324755, 3241581, 324761
-
Abstract:A method and apparatus are disclosed for enabling reconfiguration of a test system. The test system includes an adapter assembly and a tester electronics assembly. The adapter assembly includes two probe plates, which hold a probe field. The two probe plates include a plurality of holes extending through each probe plate. Each hole includes a flange area for accommodating deflection of the probes, inserted in the holes extending through the probe plates. The flange area and the use of flexible probes facilitate a deflection and an offset of the probes in the probe plates. A tester assembly includes a plurality of wear pads on the topside of a printed circuit board. The wear pads positioned to engage the bottom end of the probes. Configurable logic elements located on the underside of the printed circuit board are used to generating and receive test-signals, depending on where the probes make contact with the wear pads on the printed circuit board.
-
Method And Apparatus For Configurable Hardware Augmented Program Generation
view source -
US Patent:6876214, Apr 5, 2005
-
Filed:Aug 5, 2003
-
Appl. No.:10/634598
-
Inventors:David T Crook - Loveland CO, US
John Elliott McDermid - Loveland CO, US -
Assignee:Agilent Technologies, Inc. - Palo Alto CA
-
International Classification:G01R031/02
-
US Classification:324755
-
Abstract:A method and apparatus are disclosed for enabling reconfiguration of a test system. The test system includes an adapter assembly () and a tester electronics assembly (). The adapter assembly () includes two probe plates (), which hold a probe field (). The two probe plates () include a plurality of holes () extending through each probe plate (). Each hole () includes a flange area () for accommodating deflection of the probes (), inserted in the holes () extending through the probe plates (). The flange area () and the use of flexible probes () facilitate a deflection and an offset () of the probes () in the probe plates (). A tester assembly () includes a plurality of wear pads () on the topside of a printed circuit board (). The wear pads () positioned to engage the bottom end of the probes (). Configurable logic elements () located on the underside of the printed circuit board () are used to generating and receive test-signals, depending on where the probes make contact with the wear pads () on the printed circuit board ().
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Method And Apparatus For Supplying Power, And Channeling Analog Measurement And Communication Signals Over Single Pair Of Wires
view source -
US Patent:6901336, May 31, 2005
-
Filed:Mar 31, 2003
-
Appl. No.:10/404180
-
Inventors:Curtis Alan Tesdahl - Fort Collins CO, US
David T. Crook - Loveland CO, US
Kevin G. Chandler - Loveland CO, US -
Assignee:Agilent Technologies, Inc. - Palo Alto CA
-
International Classification:G01R019/00
-
US Classification:702 57, 455 69, 700174, 34031001, 34031002
-
Abstract:A novel technique for transferring power, measurement signals, and communication signals between two electrical devices over a single wire pair is presented. A host device supplies power to a sensor device over the wire pair. The sensor device obtains A/C signals by modulating the current component of the power signal on the wire pair. The host device de-modulates the current component of the power signal on the wire pair to recover the A/C measurement signals. The sensor device generates a serial bit stream containing sensor communication signals, and modulates it with either the voltage-or current-component of the power signal present on the wire pair. The host device appropriately de-modulates the power signal to recover the serial bit stream containing the sensor communication signals.
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Capacitive Probe Assembly With Flex Circuit
view source -
US Patent:6930494, Aug 16, 2005
-
Filed:Aug 29, 2003
-
Appl. No.:10/652232
-
Inventors:Curtis A. Tesdahl - Fort Collins CO, US
David T. Crook - Loveland CO, US -
Assignee:Agilent Technologies, Inc. - Palo Alto CA
-
International Classification:G01R027/26
-
US Classification:324690, 324686
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Abstract:A novel capacitive sensor assembly that utilizes a flex circuit for amplification of capacitively sensed signals and for separating the power, ground, and measurement signals is presented. The use of a flex circuit in the capacitive probe assembly allows implementation of multiple capacitive sensors for respectively capacitively coupling multiple signals from respective multiple test points of a circuit under test. The invention integrates the sensor plate, amplifier, and return wiring for each capacitive sensor all onto one flex circuit.
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Probe Based Information Storage For Probes Used For Opens Detection In In-Circuit Testing
view source -
US Patent:7109728, Sep 19, 2006
-
Filed:Feb 25, 2003
-
Appl. No.:10/373947
-
Inventors:David T Crook - Loveland CO, US
Curtis A Tesdahl - Fort Collins CO, US -
Assignee:Agilent Technologies, Inc. - Palo Alto CA
-
International Classification:G01R 27/26
-
US Classification:324690, 324115, 324 725
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Abstract:Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.
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Probe Based Information Storage For Probes Used For Opens Detection In In-Circuit Testing
view source -
US Patent:7492170, Feb 17, 2009
-
Filed:Aug 3, 2006
-
Appl. No.:11/498548
-
Inventors:David T. Crook - Loveland CO, US
Curtis A Tesdahl - Fort Collins CO, US -
Assignee:Agilent Technologies, Inc. - Santa Clara CA
-
International Classification:G01R 27/26
G01R 31/02 -
US Classification:324690, 324 725
-
Abstract:Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.
Plaxo
David Crooks
view sourceConsultant at davidcrooks com
David Crook
view sourceLos Angeles, CA
David Crooks
view sourceWoburn, MASr. Vice President, Product & Operations at World... Past: Cruise Staff at CUNARD Lines, Director of Escort Services at Paragon Tours Travel
David Crooks
view sourceSVP, Product & Operations at World Travel Holdings
David Crook
view sourceUniversity of Brighton
David Crook
view sourceDBA at USDA
News
High-end hotels roll out the red carpet for Fido
view source- And there seems to be no bounds to the amenities. When retired Wall Street Journal editor David Crook travelled to The Point a few years ago - a "super private, super posh former Rockefeller camp on Lake Saranac in the Adirondacks," he says - there were no kids allowed.
- Date: Jan 17, 2016
- Category: Business
- Source: Google
Grant David Crook
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David Lee Crook
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David Crook
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David PanHead Crook
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David Crook
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David Crook
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Thomas David Crook
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David Crook
view sourceYoutube
Classmates
David Crook
view sourceSchools:
Midland High School Varna IL 2000-2004
David Crook Crook (David ...
view sourceSchools:
Foothills Academy Calgary Azores 1995-1999
Community:
Chris Bennion, Justin Fung, Kelsey Peters, Matt Stewart, Megan Coleman
David Crook Crook
view sourceSchools:
Deer Run Elementary School Calgary Azores 1983-1987
Community:
Scott Main, Minelle Schnapp, Jennifer Favreau, Rebecca Neal
David Crook
view sourceSchools:
Marian Central High School Woodstock IL 1973-1977
Community:
Deborah Meyer, Thomas Siegel, Melynda Stokes, Candy Anderson
David Crook
view sourceSchools:
Edison Elementary School Detroit MI 1956-1958
Community:
Lucy Nowicki, Diane Burton, Ginny Smith
David Crook
view sourceSchools:
Viola High School Viola WI 1959-1963
Community:
Phyllis Deckert, Arthur Chitwood
David Gene Crook
view sourceSchools:
Connally High School Waco TX 1989-1993
Community:
Marlys Stewart, Jimmy Mauk
David Crook
view sourceSchools:
Lakeside High School Decatur GA 1976-1980
Community:
Sheri L, Tommy Barron, Randall Thibodeaux, Judy Darcy
Myspace
Flickr
Googleplus
David Crook
Education:
Shenfield High school - GCSE, Harlow College - A levels
Relationship:
In_a_relationship
Tagline:
I'm 24 covered in tattoos with more to come when i have the money, i enjoy clubbing and going to the cinema with my close friends and have a holiday booked with my other half for my 25th
David Crook
Education:
University of Illinois at Urbana-Champaign - Electrical Engineering
About:
Northern Colorado resident
Tagline:
Add sum mas
David Crook
Work:
The Wall Street Journal - Editor, WSJ Sunday (1995)
Education:
Tulane University - English
David Crook
Work:
Expolink Europe Limited - Chairman & Chief Executive (1996)
David Crook
David Crook
About:
Fair Oaks Remodeling was founded to provide premier remodeling services in Fair Oaks and the surrounding communities. We also provide architectural design services. We can take your dreams and make th...
David Crook
David Crook
Get Report for David Patrick Crook from Loveland, CO, age ~48