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David C Ferranti

age ~64

from Concord, MA

Also known as:
  • David J Ferranti
  • Dave C Ferranti
  • Dominick Ferranti
Phone and address:
158 Riverdale Rd, West Concord, MA 01742
(978)2879574

David Ferranti Phones & Addresses

  • 158 Riverdale Rd, Concord, MA 01742 • (978)2879574 • (978)3690987
  • Arlington, MA
  • La Grande, OR
  • Auburn Hills, MI
  • Rosemead, CA
  • Lowell, MA
  • 158 Riverdale Rd, Concord, MA 01742 • (978)5016536

Work

  • Position:
    Professional/Technical

Education

  • Degree:
    Graduate or professional degree

Us Patents

  • Method And Apparatus For Repairing Lithography Masks Using A Charged Particle Beam System

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  • US Patent:
    20010027917, Oct 11, 2001
  • Filed:
    Mar 9, 2001
  • Appl. No.:
    09/802342
  • Inventors:
    David Ferranti - Concord MA, US
    Sharon Szelag - Lynnfield MA, US
    J. Casey - West Roxbury MA, US
  • International Classification:
    C23C014/32
    G11B005/74
    C23C014/00
    G11B023/00
  • US Classification:
    204/192110, 204/192320, 204/298040, 204/298360, 250/492210, 360/131000
  • Abstract:
    A method of repairing opaque defects in lithography masks entails focused ion beam milling in at least two steps. The first step uses a large pixel spacing to form multiple holes in the defect material, with the milled area extending short of the defect material edge. The final step uses a pixel spacing sufficiently close to produce a smooth floor on the milled area, and extends to the edge of the defect. During the second step, an etch enhancing gas such as bromine is preferably used.
  • Repairing Defects On Photomasks Using A Charged Particle Beam And Topographical Data From A Scanning Probe Microscope

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  • US Patent:
    20040121069, Jun 24, 2004
  • Filed:
    Aug 7, 2003
  • Appl. No.:
    10/636309
  • Inventors:
    David Ferranti - Concord MA, US
    Valery Ray - Haverhill MA, US
    Gerald Smith - Nashua NH, US
    Christian Musil - New Providence NJ, US
  • International Classification:
    C23C014/28
  • US Classification:
    427/140000, 427/595000, 118/715000
  • Abstract:
    Topographical data from a scanning probe microscope or similar device is used as a substitute for endpoint detection to allow accurate repair of defects in phase shift photomasks using a charged particle beam system. The topographical data from a defect area is used to create a display of a semitransparent topographical map, which can be superimposed over a charged particle beam image. The density of the topographical image and the alignment of the two images can be adjusted by the operator in order to accurately position the beam. Topographical data from an SPM can also be used to adjust charged particle beam dose for each point within the defect area based upon the elevation and surface angle at the particular point.
  • Nanopore Fabrication And Applications Thereof

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  • US Patent:
    20140319339, Oct 30, 2014
  • Filed:
    Jun 6, 2012
  • Appl. No.:
    14/124434
  • Inventors:
    Adam R. Hall - Clemmons NC, US
    Jijin Yang - Acton MA, US
    David C. Ferranti - Concord MA, US
    Colin Sanford - Atkinson NH, US
  • International Classification:
    H01J 37/305
    G01N 15/10
    H01J 37/26
  • US Classification:
    250307, 435 5, 20419234
  • Abstract:
    In one aspect, methods of nanopore formation in solid state membranes are described herein, In some embodiments, a method of forming an aperture comprises providing at least one solid state membrane in a chamber, selecting a first dose of ions sufficient to provide a first aperture of predetermined diameter through the membrane and exposing a surface of the membrane at a first location to the first dose of ions in a focused ion beam having a focal point of diameter less than or equal to about 1 nm to remove material from the membrane at the first location thereby providing the first aperture having the predetermined diameter or substantially the predetermined diameter.

Isbn (Books And Publications)

Paying for Health Services in Developing Countries: An Overview

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Author
David De Ferranti

ISBN #
0821305026

Securing Our Future in a Global Economy

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Author
David De Ferranti

ISBN #
0821347306

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David de Ferranti

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David S. Ferranti

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David Ferranti

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David Ferranti Photo 4

David S. Ferranti

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David Ferranti Photo 5

David Ferranti

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Classmates

David Ferranti Photo 6

David Ferranti

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Schools:
Fullerton Union High School Fullerton CA 1973-1977
Community:
Katy Schatzman, Scott Vansickel, Deborah Iandoli, Kelly Martinez
David Ferranti Photo 7

David S. Ferranti

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Schools:
Handy High School Bay City MI 1978-1982
Community:
Susan Derosier
David Ferranti Photo 8

David Ferranti

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Schools:
Nicholas A. Ferri Middle School Johnston RI 1995-1999
Community:
Julie Marcaccio, Jason Maguire, Jillian Frappied, Maryanna Capraro, Anna Sullivan, Amanda Faella, Melissa Dias, Toni Fuoco, Timothy Sherman, Kyle Wachter, Scott Leamons
David Ferranti Photo 9

Nicholas A. Ferri Middle ...

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Graduates:
David Ferranti (1995-1999),
Kyle Wachter (1994-1998),
Patt Meyer (1978-1982),
Hoang Donila (1978-1982)

Googleplus

David Ferranti Photo 10

David Ferranti

Youtube

Leadership Conference David Ferranti

Session 5.

  • Duration:
    1h 11m 37s

Guest Speaker: David Ferranti

  • Duration:
    48m 31s

Guest Speaker: Pastor David Ferranti

  • Duration:
    51m 13s

Citizen engagement and accountable government...

3ie and IEG collaborated to host an interactive dialogue anchored in e...

  • Duration:
    1h 30m 27s

Leadership Vlog | David Ferranti

  • Duration:
    11m 15s

Pastor David Ferranti

Broadcast live from Cornerstone Church in Cheshire, CT.

  • Duration:
    23m 26s

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