David Heaps

US Patent:

20150323451, Nov 12, 2015

Filed:

May 8, 2014

Appl. No.:

14/273252

Inventors:

- Tokyo, JP
David HEAPS - Yardley PA, US
Mark SULLIVAN - Framingham MA, US

Assignee:

Advantest Corporation - Tokyo

International Classification:

G01N 21/3563
G01B 11/06
G01N 21/3586

Abstract:

A method of determining a density of a roller compacted ribbon is disclosed. The method comprises compacting dry pharmaceutical powder between press rollers of a roller compactor to produce a compact ribbon. The method also comprises determining a thickness at a point on the compact ribbon in a non-invasive manner after it has rolled out from in between the press rollers. Further, the method comprises passing the compact ribbon through a gap in between the terahertz emitter and the terahertz detector. Next, the method comprises determining a refractive index at the point on the compact ribbon using a measurement value from the terahertz emitter and the terahertz detector and a measured value for the thickness at the point. Finally, the method comprises computing a density of the compact ribbon at the point using a value of the refractive index.

US Patent:

20150323452, Nov 12, 2015

Filed:

Jul 17, 2014

Appl. No.:

14/334529

Inventors:

- Tokyo, JP
David Heaps - Yardley PA, US
Mark Sullivan - Framingham MA, US
Richard McKay - East Windsor NJ, US
Eiji Kato - Princeton NJ, US

International Classification:

G01N 21/3586
G01N 21/3563
G01B 11/06
G01N 33/15

Abstract:

A method of determining material properties for an object under test is disclosed. The method comprises determining a thickness at a point on the object under test in a non-invasive manner. It also comprises obtaining a terahertz measurement by passing terahertz radiation through the object under test using a terahertz emitter and detecting the terahertz radiation using a terahertz detector. Finally, it comprises determining an optical property at the point on the object under test using a measurement value from the terahertz emitter and the terahertz detector and a measured value for the thickness at the point.