The invention relates to a variable gain distributed amplifier for use at microwave frequencies, and fabricated in a monolithic microwave integrated circuit format. In the amplifier, the attenuation is varied, based upon digital control of a dual gate segmented FET. The amplifier has a nearly flat insertion phase and amplitude response, and an insertion phase response that varies only slightly between gain settings. The amplifier employs segmented dual gate field effect transistors as the gain elements, having their signal input and signal output electrodes which provide shunt capacities (C. sub. G1S, C. sub. DS) interconnected with serial inductances to form separate low pass transmission lines having relatively high cut-off frequencies. The amplifier has means to insure stability and uses Chebyshef equal ripple techniques to linearize the amplitude and insertion phase response.
Low Power Consumption Process-Insensitive Feedback Amplifier
David R. Helms - Liverpool NY Michael J. Fithian - Liverpool NY
Assignee:
Martin Marietta Corporation - Syracuse NY
International Classification:
H03F 134
US Classification:
330277
Abstract:
A low power consumption amplifier that is essentially insensitive to the process used to fabricate the active devices of the amplifier employs feedback to minimize variations in electrical characteristics of the devices. For weight-sensitive microwave applications, a high electron mobility transistor (HEMT) or a pseudomorphic high electron mobility transistor (PHEMT) may be selected as an active device for each stage of the amplifier. HEMTs and PHEMTs typically exhibit greater device gain than do MESFETs, especially at the upper portion of X-band and above, so that a HEMT- or PHEMT-based stage of an amplifier where additional overall gain is required, can be achieved without significantly adversely affecting power consumption demands, and attendant electrical energy storage/generation requirements while achieving and/or maintaining an overall flat gain characteristic of the amplifier.
Electronically Reconfigurable Digital Pad Attenuator Using Segmented Field Effect Transistors
Paul D. Cooper - Baldwinsville NY Paul A. Bourdelais - Liverpool NY Anthony W. Jacomb-Hood - North Syracuse NY John A. Windyka - Liverpool NY David R. Helms - Liverpool NY Ronald J. Naster - Liverpool NY
Assignee:
General Electric Company - Syracuse NY
International Classification:
H03H 1124
US Classification:
333 81R
Abstract:
An electronically reconfigurable digital pad attenuator is disclosed using selectively controlled segmented field effect transistors in a passive, non-gain state as the principal impedance elements. The attenuator may be fabricated in the monolithic microwave integrated circuit (MMIC) format with a segmented gate field effect transistor being connected in each of the separate branches of a Pi pad, Tee pad, or Bridged Tee pad attenuator configuration. The individual FET segments are maintained in a high admittance "ON" state or a low admittance "OFF" state in accordance with the binary control potentials applied to the gate of each segment, the principal electrodes being maintained at a zero potential difference. The attenuation then becomes a function of the binary gate potentials applied to each segment and assumes one of a set of well-defined discrete values. The attenuator consumes minimum power, provides attenuation steps that are independent of GaAs MMIC fabrication process tolerances, i. e.
Prairie Island Outage Red Wing, MN Feb 2011 to Jun 2011 DOSIMETRY PROCESSESAmerican Electric Power Corporation Bridgman, MI 1993 to 2000 SENIOR STAFF HEALTH PHYSICISTNiagara Mohawk Power Corporation
1988 to 1993 SENIOR TRAINING INSTRUCTORNiagara Mohawk Power Corporation
1981 to 1988 DOSIMETRY AND ALARA COORDINATORRADIATION MANAGEMENT CORPORATION Philadelphia, PA 1971 to 1981 Laboratory Operations - Gamma Spec
Education:
Rensselaer Polytechnic Institute 2011 Nuclear Utilities FundamentalsCairn University Langhorne, PA 1976 BSTemple University Philadelphia, PA 1971 BA in Physics
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