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David Earl Hurdsman

age ~50

from Spring Valley, CA

Also known as:
  • David E Hurdsman
  • Elder Hurdsman
  • Dave Hurdsman
  • David N
Phone and address:
1234 Darby St, Spring Valley, CA 91977
(619)4658176

David Hurdsman Phones & Addresses

  • 1234 Darby St, Spring Valley, CA 91977 • (619)4658176
  • 8451 Roach Dr, La Mesa, CA 91941 • (619)4658176
  • 8457 Roach Dr, La Mesa, CA 91941
  • 321 500, Logan, UT 84321 • (435)7558176
  • 654 700, Brigham City, UT 84302 • (435)7235858
  • San Diego, CA

Education

  • Degree:
    Associate degree or higher

Emails

Us Patents

  • Method For Making Transmission Measurements In A Dual-Chambered Anechoic Chamber Using Spatial Averaging

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  • US Patent:
    6842013, Jan 11, 2005
  • Filed:
    Jun 9, 2004
  • Appl. No.:
    10/868455
  • Inventors:
    John Harold Meloling - San Diego CA, US
    David Earl Hurdsman - La Mesa CA, US
    Wendy Marie Massey - San Diego CA, US
  • Assignee:
    The United States of America as represented by the Secretary of the Navy - Washington DC
  • International Classification:
    G01R 2704
    G01R 2732
  • US Classification:
    324637, 324627, 702 57
  • Abstract:
    A method for making transmission measurements in a dual-chambered anechoic chamber used in conjunction with spatial averaging. At selected transmitter antenna positions, measurement are taken at different frequencies. For each transmitter position, a measurement is made with the test device positioned between the apertures, and another without the test device. When all desired measurements have been made, the measurement data are spatially averaged; i. e. , the measurements are scaled, summed, and averaged, providing more accurate transmission measurements.
  • Multiband Current Probe Fed Antenna

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  • US Patent:
    7994992, Aug 9, 2011
  • Filed:
    Oct 4, 2007
  • Appl. No.:
    11/867046
  • Inventors:
    Daniel Tam - San Diego CA, US
    Robert S. Abramo - Colorado Springs CO, US
    Peder Hansen - San Diego CA, US
    James C. Logan - San Diego CA, US
    David E. Hurdsman - Spring Valley CA, US
  • Assignee:
    The United States of America as represented by the Secretary of the Navy - Washington DC
  • International Classification:
    H01Q 1/34
  • US Classification:
    343709, 343715, 343725
  • Abstract:
    A multi-band antenna comprising a conductive structure and a plurality of current probes coupled around the conductive structure. Each current probe is designed to receive and transmit in a substantially different frequency band than the other current probes. The current probes are positioned on the conductive structure so as to effectively create a plurality of transmit/receive antennas such that each respective antenna has a voltage standing wave ratio (VSWR) of less than or equal to approximately 3:1 for a given range within each respective frequency band.
  • Dual Chambered Anechoic Chamber

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  • US Patent:
    6784670, Aug 31, 2004
  • Filed:
    Aug 21, 2002
  • Appl. No.:
    10/227636
  • Inventors:
    John Harold Meloling - San Diego CA
    David Earl Hurdsman - La Mesa CA
    Wendy Marie Massey - San Diego CA
  • Assignee:
    The United States of America as represented by the Secretary of the Navy - Washington DC
  • International Classification:
    G01R 2728
  • US Classification:
    324627, 324637, 343703
  • Abstract:
    A dual-chambered anechoic chamber used in conjunction with spatial averaging for making transmission measurements of electromagnetic devices. The anechoic chamber includes a first tapered chamber with a first aperture, a second tapered chamber with a second aperture opposed to the first aperture, an alignment apparatus for aligning the two chambers and, if necessary, for positioning a test device between the apertures, and a positioning mechanism for mounting and determining the position of a transmitter antenna. A receiver antenna in the second chamber receives test signals transmitted from the transmitter antenna. At selected transmitter antenna positions, measurements are taken at different frequencies. For each transmitter position, a measurement is made with the test device positioned between the apertures, and another without the test device. When all desired measurements have been made, the measurement data are spatially averaged; i. e.

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