David A Lind

US Patent:

6363507, Mar 26, 2002

Filed:

Oct 19, 1998

Appl. No.:

09/174866

Inventors:

Eric L. Truebenbach - Sudbury MA
Richard P. Davis - Beverly MA
John J. Arena - Reading MA
Teresa P. Lopes - Somerville MA
David J. Lind - Stoughton MA

Assignee:

Teradyne, Inc. - Boston MA

International Classification:

G01R 3128

US Classification:

714734

Abstract:

Analog test instrument architecture for performing functional testing of electronic circuit assemblies is disclosed. The analog test instrument includes a plurality of identical channels, each channel including circuitry for driving test stimuli and measuring responses at one node of a circuit assembly under test. The driver and measurement circuitry in each channel implement functions that traditionally have been implemented in a test system using discrete instruments. The analog test instrument further includes a master clock reference, which is used for synchronizing the operation of the driver and measurement circuits. Each channel further includes triggering circuitry for distributing trigger events within the channel and to the other channels; and, an input buffer, which is shared by the measurement circuits in the channel. The synchronized operation, distributed trigger events, and shared input buffers are used to improve the correlation of measurements made during functional testing.

US Patent:

20130111505, May 2, 2013

Filed:

Oct 28, 2011

Appl. No.:

13/284491

Inventors:

Lloyd K. Frick - Pepperell MA, US
David John Lind - North Andover MA, US

Assignee:

Teradyne, Inc. - North Reading MA

International Classification:

G06F 9/46

US Classification:

719328

Abstract:

In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.