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David James Odendahl

age ~62

from Kirkland, WA

Also known as:
  • David J Odendahl
  • David James Odenhahl
  • Dave J Odendahl
  • David J Odenhahl
Phone and address:
11630 NE 155Th St, Kirkland, WA 98034
(425)3981849

David Odendahl Phones & Addresses

  • 11630 NE 155Th St, Kirkland, WA 98034 • (425)3981849
  • 11630 155Th St, Bothell, WA 98011 • (425)3981849
  • Tulsa, OK
  • 1300 Umbrella Ave, Broken Arrow, OK 74012 • (918)2523139
  • Inglewood, CA
  • Los Angeles, CA

Us Patents

  • Device And Method For Measuring A Gap Between Members Of A Structure For Manufacture Of A Shim

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  • US Patent:
    20080110275, May 15, 2008
  • Filed:
    Nov 1, 2006
  • Appl. No.:
    11/555315
  • Inventors:
    DAVID J. ODENDAHL - Bothell WA, US
  • International Classification:
    G01B 7/16
  • US Classification:
    73780
  • Abstract:
    An apparatus for measuring a gap between a first mating surface of a first component and a second mating surface of a second component has a substrate. A plurality of capacitive sensors is coupled to the substrate. A controller is coupled to the plurality of capacitive sensors. The controller is used to select each individual capacitive sensor to measure the gap between the first mating surface of the first component and the second mating surface of the second component.
  • Determining Hole Locations For Parts

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  • US Patent:
    20170220021, Aug 3, 2017
  • Filed:
    Jan 29, 2016
  • Appl. No.:
    15/010081
  • Inventors:
    - Chicago IL, US
    Bela Laszlo Zold - Stanwood WA, US
    Peter H. Bui - Lynnwood WA, US
    David James Odendahl - Kirkland WA, US
    Frederick James Richter - Everett WA, US
  • International Classification:
    G05B 19/19
  • Abstract:
    A method and apparatus for machining a part for an assembly. First sensor data is acquired for a surface of a first part from a first sensor system. Second sensor data is acquired for a set of existing holes in a second part from a second sensor system. A surface model of the surface of the first part is generated using the first sensor data. First offset data is computed based on a nominal model of a third part that is nominally positioned relative to the surface model within a three-dimensional virtual environment. Second offset data is computed for the set of existing holes using the second sensor data. Overall offset data is generated using the first and second offset data, wherein the overall offset data is used to drill a set of holes in the third part for use in fastening the third part to the second part.
  • Manufacturing Systems And Methods

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  • US Patent:
    20140236334, Aug 21, 2014
  • Filed:
    Feb 20, 2013
  • Appl. No.:
    13/771748
  • Inventors:
    The Boeing Company - , US
    Rich H. Morihara - Bellevue WA, US
    David J. Odendahl - Kirkland WA, US
    Frederick J. Richter - Everett WA, US
    Chris Stedman - Bellevue WA, US
    Sidlaghatta N. Venkatesh - Renton WA, US
  • Assignee:
    The Boeing Company - Chicago IL
  • International Classification:
    G06F 17/50
  • US Classification:
    700 97
  • Abstract:
    Manufacturing systems and methods are disclosed. In one example, a computer based system comprises a non-transitory computer readable memory, a processor, and logic instructions stored in the non-transitory computer readable memory. When executed by the processor, the logic instructions configure the processor to perform operations, comprising receiving a first digital map of a first component and a second digital map of a second component, defining a first surface on the first component and a second surface on the second component, wherein at least a portion of the first surface is to adjoin at least a portion of the second surface in a manufactured assembly, updating a first part definition for the first component to include the first surface and, optionally, updating a second part definition for the second component to include the second surface.

Googleplus

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David Odendahl

Myspace

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DAVId Odendahl

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Locality:
MADRID, New York
Birthday:
1937
David Odendahl Photo 3

David Odendahl

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Locality:
BOTHELL, Western Australia
Birthday:
1922

Classmates

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David Odendahl

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Schools:
Tower High School Warren MI 1976-1980
Community:
Karen Yates, James Linehan, Joseph Lacroix
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Tower High School, Warren...

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Graduates:
David Odendahl (1976-1980),
Denise Dyar (1977-1981),
Jan Batty (1982-1986),
Cheryl Hyduk (1978-1982),
Peter Cianci (1982-1986),
Matthew Noppenberger (1984-1988)

Youtube

How Business Measures Sustainability - Grace ...

Taking a business-like approach, this panel session examines the impor...

  • Category:
    Nonprofits & Activism
  • Uploaded:
    10 Jan, 2011
  • Duration:
    1h 25m 9s

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David Odendahl

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David Odendahl

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