Shahid A. Butt - Ossining NY, US Allen H. Gabor - Katonah NY, US Donald J. Samuels - Silverthorne CO, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H04L 21/00
US Classification:
438157, 438592, 257E21039
Abstract:
Methods of forming adjacent polyconductor line ends and a mask therefor are disclosed. In one embodiment, the method includes forming a polyconductor layer over an isolation region; forming a mask over the polyconductor layer, the mask including shapes to create the polyconductor line ends and a correction element to ensure a designed proximity of the polyconductor line ends; and etching the polyconductor layer using the patterned photoresist mask to create the adjacent polyconductor line ends, wherein the correction element is removed during the etching.
Shahid A. Butt - Ossining NY, US Allen H. Gabor - Katonah NY, US Donald J. Samuels - Silverthorne CO, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 21/00
US Classification:
438157, 438592, 430 5, 257E21039
Abstract:
Methods of forming adjacent polyconductor line ends and a mask therefor are disclosed. In one embodiment, the method includes forming a polyconductor layer over an isolation region; forming a mask over the polyconductor layer, the mask including shapes to create the polyconductor line ends and a correction element to ensure a designed proximity of the polyconductor line ends; and etching the polyconductor layer using the patterned photoresist mask to create the adjacent polyconductor line ends, wherein the correction element is removed during the etching.