Donna L Michael

US Patent:

20090193369, Jul 30, 2009

Filed:

Jan 30, 2008

Appl. No.:

12/022860

Inventors:

Darin A. Chan - Santa Clara CA, US
Yi Zou - Sunnyvale CA, US
Yuansheng Ma - Santa Clara CA, US
Marilyn Wright - Sunnyvale CA, US
Mark Michael - Cedar Park TX, US
Donna Michael - Cedar Park TX, US

Assignee:

Advanced Micro Devices, Inc. - Sunnyvale CA

International Classification:

G06F 17/50

US Classification:

716 4

Abstract:

The present invention generates model scenarios of semiconductor chip design and uses interpolation and Monte Carlo, with random number generation inputs, techniques to iteratively assess the models for a more comprehensive and accurate assessment of design space, and evaluation under projected manufacturing conditions. This evaluation information is then incorporated into design rules in order to improve yield.