Dr. Tran graduated from the Ross Univ, Sch of Med, Roseau, Dominica in 1999. He works in Yuba City, CA and specializes in Internal Medicine. Dr. Tran is affiliated with Fremont Medical Center, Rideout Regional Medical Center and UC Davis Medical Center.
Dr. Tran graduated from the Louisiana State University School of Medicine at New Orleans in 1999. He works in Metairie, LA and specializes in Family Medicine. Dr. Tran is affiliated with East Jefferson General Hospital.
Engineering Tech Santa Clara, CA Oct 2000 to Nov 2012 Avantex ControllerIntel Corporation Sacramento, CA Nov 1998 to Oct 2000Powerwave Technology Folsom, CA Nov 1998 to Nov 1999 Senior Electronic TechPackard Bell-NEC Company Sacramento, CA Feb 1995 to Oct 1998 Manufacturing EngineerEngineering Tech Sacramento, CA Sep 1989 to Feb 1995 Processor boards, Video boards
Education:
Sacramento State University 1988 B.S.Mission College 1984 A.S
Vi at Palo Alto Palo Alto, CA Dec 2010 to Dec 2013 Community Relations ManagerVi at Palo Alto Palo Alto, CA Oct 2007 to Dec 2010 Executive AssistantVi at Palo Alto Palo Alto, CA Aug 2006 to Oct 2007 Sales AssistantCost Plus World Market Pensacola, FL Jun 2005 to May 2006 SupervisorDiscovery Channel Store Pensacola, FL Jul 2000 to Jun 2005 Assistant Store Manager
Education:
Notre Dame de Namur University Belmont, CA Jun 2010 BS in Business AdministrationPensacola Junior College Pensacola, FL Jan 2002 AA in Business
Sep 2002 to 2000 Production testerENCORE NETWORKS INC Dulles, VA Jul 2002 to May 2003 Integrated System TechnicianIOWAVE INC Arlington, VA Jun 2000 to Sep 2001 Debug TechnicianFASTCOMM COMMUNICATIONS CORPORATION Sterling, VA Mar 1993 to Jun 2000 Pick & Place Machine ProgrammerC3 INC Herndon, VA May 1990 to Dec 1992 Bench Technician
Kyung Joon Han - Palo Alto CA Joo Weon Park - Pleasanton CA Dung Tran - San Jose CA Steve K. Hsia - San Jose CA Jong Seuk Lee - Palo Alto CA Dae Hyun Kim - Fremont CA
Assignee:
NexFlash Technologies, Inc. - San Jose CA
International Classification:
G11C 1604
US Classification:
36518524, 36518526, 3651853, 36518529
Abstract:
A convergence signal includes a series of voltage pulses used to perform a convergence procedure in one or more flash EEPROM memory cells (transistors). In one instance subsequent voltage pulses in the convergence signal each have a higher voltage than the preceding pulse. In another instance, subsequent voltage pulses in the convergence signal each have a longer duration than the preceding pulse. An integrated circuit includes an array of memory cells and an erase control unit which controls the application of the convergence signal to one or more memory cells. The integrated circuit may be either serial or parallel flash EEPROM in which bulk, sector, or page mode erasing is used.
Method And Apparatus For Multiple Byte Or Page Mode Programming Of A Flash Memory Array
Kyung Joon Han - Palo Alto CA Dung Tran - San Jose CA Steven W. Longcor - Mountain View CA Steve K. Hsia - San Jose CA
Assignee:
NexFlash Technologies, Inc. - San Jose CA
International Classification:
G11C 1604
US Classification:
36518528, 36518717, 36518518
Abstract:
A memory array contains memory cells designed to be erased using Fowler-Nordheim (âFNâ) tunneling through the channel area, and programmed using either channel hot electron injection (âCHEâ) or channel-initiated secondary electron injection (âCISEIâ). To reduce disturbance of the floating gate potential of unselected memory cells during programming operations and read operations, the unselected word lines are brought to a negative potential rather than ground potential. To reduce disturbance of the floating gate potential of unselected memory cells during FN erase operations, the unselected word lines are brought to a positive potential rather than ground potential.
Method And Apparatus For Multiple Byte Or Page Mode Programming Of A Flash Memory Array
Steve K. Hsia - San Jose CA Kyung Joon Han - Palo Alto CA Dung Tran - San Jose CA
Assignee:
NexFlash Technologies, Inc. - San Jose CA
International Classification:
G11C 1604
US Classification:
36518528, 36518518, 36536517
Abstract:
A memory array contains memory cells designed to be erased using Fowler-Nordheim (âFNâ) tunneling through the channel area, and programmed using either channel hot electron injection (âCHEâ) or channel-initiated secondary electron injection (âCISEIâ). To reduce disturbance of the floating gate potential of unselected memory cells during programming operations and read operations, the unselected word lines are brought to a negative potential rather than ground potential. To reduce disturbance of the floating gate potential of unselected memory cells during FN erase operations, the unselected word lines are brought to a positive potential rather than ground potential.
Cung Vu - San Jose CA, US Dung Tran - Milpitas CA, US
International Classification:
H03L 5/00
US Classification:
327333
Abstract:
Multistage signal amplification, including level translation, improves signal integrity, e.g., slew rate, complementary signal delay and duty cycle performance, by mirroring complementary output current in an output stage based on a signal developed in an input stage pull-up network. A multistage amplifier may comprise a first stage comprising a differential input circuit coupled, respectively, between first and second inputs and first and second nodes, wherein the first node is coupled to a first pull-up circuit controlled by the first node and the second node is coupled to a second pull-up circuit controlled by the second node; and a second stage comprising a complementary output circuit coupled, respectively, between first and second nodes and first and second outputs, wherein a current mirror sinks essentially the same current at the first output as is sourced at the second output and vice versa. The pull-up network may further comprise a cross-coupled pull-up circuit.
Method And Apparatus For Detecting Failed Batteries
Larry D. Reeves - Palo Alto CA Dung A. Tran - San Jose CA
Assignee:
Compaq Computer Corporation - Cupertino CA
International Classification:
G01N 27416
US Classification:
324434
Abstract:
A technique for detecting failed batteries while the battery is attached to one or more electronic devices and is receiving a float charge is disclosed. The float voltage minimizes the normal voltage differences between battery cells. The technique employs a ratio comparative analysis of cell voltages of a battery provided across the terminals of the battery. Application of the ratio comparative analysis in assessing the condition of a battery assumes an equal voltage drop across each battery cell such that the cells are modeled as a series of resisters with respect to the float voltage. Such equal voltage drop enables a comparative ratio analysis of the voltage across each of the two portions of the battery's cell stack to the voltage across the entire battery. The comparative ratio analysis determines a voltage threshold that identifies whether a battery has a shorted or open cell.
Ecl Prom Programming Method And Apparatus Using Ecl Addressing Means
An apparatus for programming an ECL PROM comprises conventional ECL row and column address circuits for selecting a particular fuse in the ECL PROM. The selection of a particular fuse in the ECL PROM generates a control signal in the address decoders corresponding thereto which enables a current drive gate and a current sink gate coupled thereto. A row program control circuit and a column program circuit are then enabled by an increase of potential applied thereto for turning on the current drive gate and the current sink gate coupled to the selected fuse. The turning on of the current drive gate and the current sink gate coupled to the selected fuse causes 50 to 10 milliamps to flow through the selected fuse, blowing the fuse.
A charge pump essentially incorporating parallel connections of low capacity charge pumps, where each low capacity charge pump is controlled by a clock signal, where the clock signal associated with a low capacity charge pump has a phase different than the other clock signals. Hence, the output of these essentially parallel connected charge pumps will have a ripple period which is a fraction of the period of any single clock signal, wherein the fraction is equal to 1/n, where n is the number of parallel low capacity charge pumps. This results in a ripple magnitude of 1/n that of charge pumps using a single clock source with identical input and output capacitance.
Circuit And Method For Extracting Clock Signal From A Serial Data Stream
Richard J. Kelly - Santa Clara CA Andrew C. Graham - Sunnyvale CA Dung Q. Tran - San Jose CA
Assignee:
Gazelle Microcircuits, Inc. - Santa Clara CA
International Classification:
H04L 700
US Classification:
375106
Abstract:
In accordance with the invention, a circuit and a method for extracting a clock signal from a serial data stream are provided. A window pulse is generated such that transitions of a delayed version of the serial data stream occur near the center of the window pulse. A PUP signal and a PDN signal are generated having pulse widths indicative of the time at which transitions of the clock signal occur with respect to the window pulse. The PUP and PDN signals are used to generate a reference voltage to control the clock frequency. Window pulses may be generated in response to only positive transitions or to only negative transitions of the delayed serial data stream, or alternatively may be generated in response to both negative and positive transistions. The amount of delay introduced to the serial data stream may be selectively adjusted for different bit rates.