Dustin D Fast

US Patent:

20230051895, Feb 16, 2023

Filed:

Aug 12, 2021

Appl. No.:

17/401149

Inventors:

- Chicago IL, US
Sayata Ghose - Sammamish WA, US
Brice A. Johnson - Federal Way WA, US
Dustin Fast - Owens Cross Roads AL, US

International Classification:

G06T 7/00
G06T 7/12
G06T 7/33
B32B 41/00
B32B 38/18
B32B 37/06
B32B 37/10
B32B 37/18
B32B 3/14
B32B 3/18
B29C 70/54
B29C 70/34
B29C 73/24

Abstract:

A method of detecting defects in a composite layup includes capturing, using an infrared camera, reference images of a reference layup being laid up by a reference layup head. The method also includes manually reviewing the reference images for defects, and generating reference defect masks indicating defects in the reference images. The method further includes training, using the reference images and reference defect masks, a neural network, creating a machine learning model that, given a production image as input, outputs a production defect mask indicating the defect location and the defect type of each defect. The method also includes capturing, using an infrared camera, production images of a production layup being laid up by the production layup head, and applying the model to the production images to automatically generate a production defect masks indicating each defect in the production images.