Earle W Gillis

US Patent:

61985295, Mar 6, 2001

Filed:

Apr 30, 1999

Appl. No.:

9/303187

Inventors:

John C. Clark - Vestal NY
Earle W. Gillis - Apalachin NY
Christopher J. Majka - Apalachin NY
Matthew F. Seward - Windsor NY
Michael M. Westgate - Webster NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01N 2100

US Classification:

3562375

Abstract:

An automated inspection system particularly adapted for detection and discrimination of surface irregularities of specularly reflecting and other materials, such as are employed in laminate chip carriers and printed circuit boards, includes an area scan image sensor allowing illumination sources to surround an area of a surface being inspected. The illumination source preferably provides either or both bright field and dark field illumination of the surface; developing generally complementary images of surface irregularities. A self-registering rules-driven process for developing inspection masks reduces alignment operations and improves performance. Image enhancement and morphological operations to detect surface irregularities are performed by digital signal processing, preferably using a dedicated vision processor. Masks screen potential defects to critical mounting and bonding surfaces accurately without requiring alignment of data or reference images to acquired images. Since potential defects are copied from acquired images and stored, verification of defects may be performed without further access to the inspected part and without removal of the part to another specialized apparatus, simplifying processing and increasing throughput and operator efficiency.

US Patent:

56107102, Mar 11, 1997

Filed:

May 28, 1996

Appl. No.:

8/654513

Inventors:

Donald H. Canfield - Vestal NY
Todd C. Fellows - Endicott NY
Earle W. Gillis - Apalachin NY
Peter J. Yablonsky - Apalachin NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01N 2100

US Classification:

356237

Abstract:

A dual mode illumination system for optical inspection of products for surface defects and defects in holes in the product includes a first light source for providing illumination along an axis of one or more holes in the product to be inspected, the first light source being positioned on a first side of the product, a second light source providing illumination of the surface of the second side of the product to be inspected, a beam splitter for redirecting light from the second light source to a light sensor while passing light from the first light source to the light sensor. The second light source may be located adjacent to a second side of the product to be tested with the axis of illumination parallel to a major plane of the product. The light sensor may be a video camera connected to a data processing and display system.