Jed Griffin - Forest Grove OR Ernest Khaw - Beaverton OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H03K 1716
US Classification:
326 30, 326 27, 326 83, 327112
Abstract:
A circuit is presented having many transistors connected in parallel between a supply node and a pre-drive stage. The many transistors each have a gate connected to a delay select line to control current through the pre-drive stage. Also presented is a circuit having a first stack of transistors connected between a first supply node and a pre-drive stage. The circuit also has a second stack of transistors connected between a second supply node and the pre-drive stage, and many delay select lines. The stack of transistors each have a gate connected to one of the delay select lines.
Method And Apparatus For Debugging Ternary And High Speed Busses
Sanjay Dabral - Palo Alto CA Ramesh Senthinathan - Folsom CA Ming Zeng - San Jose CA Keith Self - Aloha CA Ernest Khaw - Beaverton OR Chung-Wai Yue - Worchester MA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G06F 1100
US Classification:
714 43
Abstract:
An apparatus and method for debugging a bus including interposing a device that monitors the data transferred between two devices on the bus such that the bus is split into two busses, with data being copied for transmission to a diagnostics device as the data is transferred between the two busses.
Jed Griffin - Forest Grove OR Ernest Khaw - Beaverton OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H03K 1716
US Classification:
326 30, 326 86, 327108
Abstract:
According to one aspect of the invention, a circuit is provided that includes a drive stage having an input and output node, and at least one transistor coupled between the two nodes. An upper impedance element coupled at one end to the output node and at another end to an upper supply node is provided. The upper impedance element has a stack of transistors each having a beta matched to a beta of at least one transistor in the drive stage. A lower impedance element coupled at one end to the output node and at another end to a lower supply node is provided. The lower impedance element has a stack of transistors each having a beta matched to the beta of at least one transistor in the drive stage. In another embodiment, a circuit is provided that includes a plurality of transistors coupled in parallel between a supply node and a pre-drive stage. The plurality of transistors each have a gate coupled to a delay select line to control current through the pre-drive stage.
Ampere Oct 2019 - Mar 2020
Soc Silicon Development Director In Program Management
Intel Corporation Oct 2019 - Mar 2020
Soc Technical Program Director
Nvidia Apr 2013 - Mar 2015
Chip Physical Design Engineering Manager
Intel Corporation Jan 1998 - Mar 2013
Chip Physical Design Engineering Manager
Intel Corporation Jan 1995 - Dec 1997
Chip Design Automation Engineering Manager
Education:
Oregon Graduate Institute 1989 - 1991
Masters, Electronics Engineering
Oregon State University 1984 - 1988
Bachelors, Electronics Engineering
Oregon Graduate Institute 1958 - 1965
Masters
Skills:
Semiconductors Intel Debugging Asic Soc Vlsi Embedded Systems Ic Rtl Design Physical Design Integrated Circuits Eda System on A Chip Application Specific Integrated Circuits Very Large Scale Integration
Languages:
English
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