Jitesh Shah - Fremont CA, US Errol Monsale - Santa Clara CA, US
International Classification:
G01R 31/00
US Classification:
32475605
Abstract:
A test assembly () for testing a device () having a heat spreader (), a package substrate () having a substrate ground (G), and a grounding conductive segment (A), includes (i) an input conductive segment () that is electrically connected to the heat spreader (), (ii) a test board () having a board ground (), and (iii) a control system () that is electrically coupled to the input conductive segment () and the board ground (). During testing, the device () is positioned so that the substrate ground (G) is electrically connected to the board ground (). Additionally, the control system () directs a test current to one of the input conductive segment () and the board ground () to test the effectiveness of the grounding conductive segment (A) including a first electrical interface (A).
Idt - Integrated Device Technology, Inc. Aug 2010 - Jun 2018
Test Hardware Supervisor
Jcet Group Co., Ltd. Aug 2010 - Jun 2018
Senior Technical Program Manager
Idt - Integrated Device Technology, Inc. Jul 2001 - Aug 2010
Hw Test Engineer
Idt - Integrated Device Technology, Inc. 1996 - 2001
Test Equipment Engineer
Team Pacific Corporation 1990 - 1996
Test Engineer
Education:
University of Phoenix
Master of Business Administration, Masters, Marketing, Business Management
University of the East
Bachelors, Electronics, Engineering, Communications
Skills:
Testing Semiconductors Mixed Signal Ic Product Engineering Test Engineering Analog Electronics Pcb Design Semiconductor Industry Dft Test Equipment Failure Analysis Design of Experiments Soc Asic Debugging Hardware Architecture