Eugene G Campbell

US Patent:

6704112, Mar 9, 2004

Filed:

Oct 17, 2000

Appl. No.:

09/690935

Inventors:

Gary E. Sommargren - Santa Cruz CA
Eugene W. Campbell - Livermore CA

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

G01B 902

US Classification:

356512, 356513

Abstract:

To measure a convex mirror, a reference beam and a measurement beam are both provided through a single optical fiber. A positive auxiliary lens is placed in the system to give a converging wavefront onto the convex mirror under test. A measurement is taken that includes the aberrations of the convex mirror as well as the errors due to two transmissions through the positive auxiliary lens. A second, measurement provides the information to eliminate this error. A negative lens can also be measured in a similar way. Again, there are two measurement set-ups. A reference beam is provided from a first optical fiber and a measurement beam is provided from a second optical fiber. A positive auxiliary lens is placed in the system to provide a converging wavefront from the reference beam onto the negative lens under test. The measurement beam is combined with the reference wavefront and is analyzed by standard methods. This measurement includes the aberrations of the negative lens, as well as the errors due to a single transmission through the positive auxiliary lens.

US Patent:

6909510, Jun 21, 2005

Filed:

Jan 23, 2004

Appl. No.:

10/764042

Inventors:

Gary E. Sommargren - Santa Cruz CA, US
Eugene W. Campbell - Livermore CA, US

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

G01B009/02

US Classification:

356512, 356513, 356515

Abstract:

To measure a convex mirror, a reference beam and a measurement beam are both provided through a single optical fiber. A positive auxiliary lens is placed in the system to give a converging wavefront onto the convex mirror under test. A measurement is taken that includes the aberrations of the convex mirror as well as the errors due to two transmissions through the positive auxiliary lens. A second measurement provides the information to eliminate this error. A negative lens can also be measured in a similar way. Again, there are two measurement set-ups. A reference beam is provided from a first optical fiber and a measurement beam is provided from a second optical fiber. A positive auxiliary lens is placed in the system to provide a converging wavefront from the reference beam onto the negative lens under test. The measurement beam is combined with the reference wavefront and is analyzed by standard methods. This measurement includes the aberrations of the negative lens, as well as the errors due to a single transmission through the positive auxiliary lens.

US Patent:

42245699, Sep 23, 1980

Filed:

Jul 19, 1978

Appl. No.:

5/920222

Inventors:

Eugene H. Campbell - Morgan Hill CA

Assignee:

National Semiconductor Corporation - Santa Clara CA

International Classification:

G01R 2302

US Classification:

324 78D

Abstract:

A stabilized display for electronic instruments that make voltage measurements, frequency measurements, and the like is disclosed. This stabilized display includes a counter, a register, a comparator, and control logic. The counter generates counts, during spaced apart time intervals, that are representative of measurements made by the instrument. Selected ones of these counts are transferred to the register in response to a LATCH signal, where they are displayed. The comparator connects to the counter and the register. It generates output signals indicating whether or not the contents of the counter and register are equal. These output signals are received by the control logic, which generates the LATCH signal in response to a predetermined sequence of non-equality indications from the comparator.