Feng Yan

US Patent:

20160092765, Mar 31, 2016

Filed:

Sep 29, 2014

Appl. No.:

14/500222

Inventors:

- Redmond WA, US
Yutaka Suzue - Issaquah WA, US
Johnson T. Apacible - Mercer Island WA, US
Karthik Kalyanaraman - Redmond WA, US
Olatunji Ruwase - Bellevue WA, US
Yuxiong He - Bellevue WA, US
Feng Yan - Williamsburg VA, US

International Classification:

G06N 3/08
H04L 29/08

Abstract:

A performance investigation tool (PIT) is described herein for investigating the performance of a distributed processing system (DPS). The PIT operates by first receiving input information that describes a graph processing task to be executed using a plurality of computing units. The PIT then determines, based on the input information, at least one time-based performance measure that describes the performance of a DPS that is capable of performing the graphical task. More specifically, the PIT can operate in a manual mode to explore the behavior of a specified DPS, or in an automatic mode to find an optimal DPS from within a search space of candidate DPSs. A configuration system may then be used to construct a selected DPS, using the plurality of computing units. In one case, the graph processing task involves training a deep neural network model having a plurality of layers.