Frank J Demonte

US Patent:

7233737, Jun 19, 2007

Filed:

Aug 12, 2003

Appl. No.:

10/639799

Inventors:

Frank J. DeMonte - Corvallis OR, US

Assignee:

Micron Technology, Inc. - Boise ID

International Classification:

G03B 17/12
G02B 7/02

US Classification:

396 89, 396529, 348340, 348345, 348375, 359819

Abstract:

A fixed-focus camera module includes an image sensor, a lens for focusing an image onto the image sensor, and a positioning structure for maintaining an alignment of the lens and image sensor. The alignment provides a desired image quality of the image focussed onto the image sensor. The positioning structure includes a first unthreaded member coupled to the lens and a second unthreaded member coupled to the image sensor. One of the first and the second members is configured to be inserted into the other of the members to provide an adjustable relative position of the lens and the image sensor.

US Patent:

7282996, Oct 16, 2007

Filed:

Apr 14, 2005

Appl. No.:

11/105752

Inventors:

Frank J. DeMonte - Corvallis OR, US

Assignee:

Micron Technology, Inc. - Boise ID

International Classification:

H03G 3/10
H03G 3/30

US Classification:

330285, 330136

Abstract:

An apparatus having an electronic amplifier with signal gain dependent bias. The electronic apparatus includes the amplifier and a bias state control circuit. The electronic amplifier has a signal gain and a bias state. The signal gain is adjustable to either of at least two different signal gain settings, and the bias state is adjustable to either of at least two different bias state settings. The bias state control circuit has capability of adjusting the bias state setting of the amplifier based upon the signal gain setting to which the amplifier is adjusted.

US Patent:

7342212, Mar 11, 2008

Filed:

Mar 31, 2006

Appl. No.:

11/395193

Inventors:

Ray Allen Mentzer - Corvallis OR, US
Frank J. DeMonte - Corvallis OR, US
Jeffery Steven Beck - Philomath OR, US
Matthew Michael Borg - Albany OR, US
Charles Grant Myers - Corvallis OR, US

Assignee:

Micron Technology, Inc. - Boise ID

International Classification:

H01L 27/00
G01J 1/44
H01J 40/14
H03F 3/08

US Classification:

2502081, 250214 R, 330308, 348300, 348308

Abstract:

An active pixel sensor (APS) image sensor comprises an array of pixel circuits corresponding to rows and columns of pixels, a plurality of amplifiers that buffer signals output by the array of pixel circuits, and a plurality of sample and hold circuits that read the buffered signals. A routing mechanism is positioned between the array of pixel circuits and the plurality of amplifiers. A controller selects a set of the pixel circuits for sampling and is configured to control the routing mechanism to couple each pixel circuit in the set to a different one of the amplifiers during a normal mode of operation and to couple each pixel circuit of a subset of pixel circuits in a first set of pixel circuits to a different amplifier of a first subset of the amplifiers, to couple each pixel circuit of a subset of pixel circuits in a second set of pixel circuits to a different amplifier of a second subset of the amplifiers, and to connect the amplifiers of the first and second subsets of amplifiers in pairs to a common one of the sample and hold circuits during a sub-sampling mode of operation.

US Patent:

7522201, Apr 21, 2009

Filed:

Jan 31, 2005

Appl. No.:

11/048479

Inventors:

Frank J. DeMonte - Corvallis OR, US
Jeffery S. Beck - Philomath OR, US

Assignee:

Aptina Imaging Corporation - Grand Cayman

International Classification:

H04N 9/64

US Classification:

348246, 348250, 3482211

Abstract:

An apparatus and method for detecting a failed reset in a pixel are described. First, a reset proxy signal that is received. Second, a reset reference signal is received. The reset proxy signal and the reset reference signal are compared. Based on the comparison, a reset status signal is generated. The reset status signal indicates that a failed reset has been detected or that a failed reset has not been detected.

US Patent:

52866521, Feb 15, 1994

Filed:

May 1, 1992

Appl. No.:

7/876934

Inventors:

Michael S. James - New Castle DE
Robert C. Kirkpatrick - Bear DE
Frank J. DeMonte - West Chester PA

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

G01N 3024

US Classification:

436 48

Abstract:

Methods for handling a plurality of sample containers to be processed by an instrument are disclosed. In a preferred embodiment, a retaining device holds the sample containers and is indexed to align one of the sample containers to a position where communication with a sample input port of the instrument is established. A stripper moves a sample container into engagement with the sample port and, most preferably, also urges the sample container into sealing engagement with the sample port. An interference fit created between the stripper an the sample container provides a positive force that permits the sample container to be withdrawn and returned to its initial position. A lower arm assembly is disclosed which acts as a stop relative to the sample container and thus, as the stripper continues to move while the sample container is being withdrawn it overcomes the force of the interference fit and disengages the stripper. The present invention permits a single sample container to be inserted into a thermal zone to reduce the effects of the thermal zone upon samples not being processed. The present invention is also useful for manipulating a plurality of columns such as capillary columns or columns packed with a sorbent.

US Patent:

54533805, Sep 26, 1995

Filed:

Feb 18, 1994

Appl. No.:

8/198724

Inventors:

John S. Poole - Elkton MD
Mark A. Nickerson - Landenberg PA
Frank J. DeMonte - West Chester PA

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

G01N 128

US Classification:

436174

Abstract:

A method for sample preparation in which a sample matrix is formed into a thin film prior to being brought into contact with an extraction solvent such that the surface area contact between the sample matrix and the solvent is maximized and the cross section of the sample matrix and corresponding diffusion path of components of interest is minimized.