Frank Yu - Palo Alto CA, US Charles C. Lee - Cupertino CA, US Abraham C. Ma - Fremont CA, US Ming-Shiang Shen - Taipei Hsien, TW
Assignee:
Super Talent Electronics, Inc. - San Jose CA
International Classification:
G11C 16/06
US Classification:
36518509, 36518522, 36518511
Abstract:
A flash memory has multi-level cells (MLC) that can each store multiple bits per cell. Blocks of cells can be downgraded to fewer bits/cell when errors occur, or for storing critical data such as boot code. The bits from a single MLC are partitioned among multiple pages to improve error correctability using Error Correction Code (ECC). An upper reference voltage is generated by a voltage reference generator in response to calibration registers that can be programmed to alter the upper reference voltage. A series of decreasing references are generated from the upper reference voltage and are compared to a bit-line voltage. Compare results are translated by translation logic that generates read data and over- and under-programming signals. Downgraded cells use the same truth table but generate fewer read data bits. Noise margins are asymmetrically improved by using the same sub-states for reading downgraded and full-density MLC cells.
Extended Usb Pcba And Device With Dual Personality
Jim Chin-Nan Ni - San Jose CA, US David Q. Chow - San Jose CA, US Frank I-Kang Yu - Palo Alto CA, US Abraham C. Ma - Fremont CA, US Ming-Shiang Shen - Taipei, TW
An extended Universal-Serial-Bus (USB) connector plug and socket each have a pin substrate with one surface that supports the four metal contact pins for the standard USB interface. An extension of the pin substrate carries another 8 extension metal contact pins that mate when both the connector plug and socket are extended. The extension can be an increased length of the plug's and socket's pin substrate or a reverse side of the substrate. Standard USB connectors do not make contact with the extension metal contacts that are recessed, retracted by a mechanical switch, or on the extension of the socket's pin substrate that a standard USB connector cannot reach. Standard USB sockets do not make contact with the extension metal contacts because the extended connector's extension contacts are recessed, or on the extension of the connector pin substrate that does not fit inside a standard USB socket.
8/9 And 8/10-Bit Encoding To Reduce Peak Surge Currents When Writing Phase-Change Memory
Charles C. Lee - Cupertino CA, US Frank I-Kang Yu - Palo Alto CA, US David Q. Chow - San Jose CA, US
Assignee:
Super Talent Electronics, Inc - San Jose CA
International Classification:
G11C 11/00
US Classification:
365163, 365148
Abstract:
Phase-change memory (PCM) cells store data using alloy resistors in high-resistance amorphous and low-resistance crystalline states. The memory cell's reset current can be double a set current, causing peak currents to depend on write data. When all data bits are reset to the amorphous state, a very high peak current is required. To reduce this worst-case peak current, the data is encoded before storage in the PCM cells. An 8/10 encoder adds 2 bits but ensures that no more than half of the data bits are reset. An 8/9 encoder adds an indicator bit, and inverts the 8 bits to ensure that no more than half of the bits are reset. The indicator bit indicates when the 8 bit are inverted, and when the 8 bits are un-inverted. Peak currents are thus reduced by encoding to reduce reset data bits.
Local Bank Write Buffers For Accelerating A Phase-Change Memory
David Q. Chow - San Jose CA, US Charles C. Lee - Cupertino CA, US Frank I-Kang Yu - Palo Alto CA, US
Assignee:
Super Talent Electronics, Inc. - San Jose CA
International Classification:
G11C 11/00
US Classification:
365163, 36523003, 36518905
Abstract:
Phase-change memory (PCM) cells store data using alloy resistors in high-resistance amorphous and low-resistance crystalline states. The time of the memory cell's set-current pulse can be 100 ns, much longer than read or reset times. The write time thus depends on the write data. The very long write-1 time may require wait states. To eliminate wait states for sequential accesses, the PCM cells are divided into 16 banks. Each bank has its own bank write latch that stores data locally at the bank while the bank is being written. Data lines to the banks are freed up to transfer data to other banks once the data is written into the local bank write latch, allowing the long set-current pulse to be applied locally to slowly grow crystals in the alloy resistors. External host data are buffered and applied to the data lines by an array data mux.
Flash / Phase-Change Memory In Multi-Ring Topology Using Serial-Link Packet Interface
A multi-ring memory controller sends request packets to multiple rings of serial flash-memory chips. Each of the multiple rings has serial flash-memory chips with serial links in a uni-directional ring. Each serial flash-memory chip has a bypassing transceiver with a device ID checker that bypasses serial packets to a clock re-synchronizer and bypass logic for retransmission to the next device in the ring, or extracts the serial packet to the local device when an ID match occurs. Serial packets pass through all devices in the ring during one round-trip transaction from the controller. The average latency of one round is constant for all devices on the ring, reducing data-dependent performance, since the same packet latency occurs regardless of the data location on the ring. The serial links can be a Peripheral Component Interconnect (PCI) Express bus. Packets have modified-PCI-Express headers that define the packet type and data-payload length.
Synchronous Page-Mode Phase-Change Memory With Ecc And Ram Cache
Charles C. Lee - Cupertino CA, US Frank I-Kang Yu - Palo Alto CA, US David Q. Chow - San Jose CA, US
Assignee:
Super Talent Electronics, Inc. - San Jose CA
International Classification:
G11C 7/10
US Classification:
3652385, 365163, 36523003
Abstract:
Phase-change memory (PCM) cells store data using alloy resistors in high-resistance amorphous and low-resistance crystalline states. The time of the memory cell's set-current pulse can be 100 ns, much longer than read or reset times. The write time thus depends on the write data and is relatively long. A page-mode caching PCM device has a lookup table (LUT) that caches write data that is later written to an array of PCM banks. Host data is latched into a line FIFO and written into the LUT, reducing write delays to the relatively slow PCM. Host read data can be supplied by the LUT or fetched from the PCM banks. A multi-line page buffer between the PCM banks and LUT allows for larger block transfers using the LUT. Error-correction code (ECC) checking and generation is performed for data in the LUT, hiding ECC delays for data writes into the PCM banks.
Recycling Partially-Stale Flash Blocks Using A Sliding Window For Multi-Level-Cell (Mlc) Flash Memory
Charles C. Lee - Cupertino CA, US Frank Yu - Palo Alto CA, US Abraham C. Ma - Fremont CA, US Ming-Shiang Shen - Taipei Hsien, TW
Assignee:
Super Talent Electronics, Inc. - San Jose CA
International Classification:
G06F 12/02
US Classification:
711103, 711156, 711206
Abstract:
A sliding window of flash blocks is used to reduce wasted space occupied by stale data in a flash memory. The sliding window slides downward over a few flash blocks. The oldest block is examined for valid pages of data, and the valid pages are copied to the end of the sliding window so that the first block has only stale pages. The first block can then be erased and eventually re-used. A RAM usage table contains valid bits for pages in each block in the sliding window. A page's valid bit is changed from an erased, unwritten state to a valid state when data is written to the page. Later, when new host data replaces that data, the old page's valid bit is set to the stale state. A RAM stale-flags table keeps track of pages that are full of stale pages.
Frank I-Kang Yu - Palo Alto CA, US David Nguyen - San Jose CA, US Jim Chin-Nan Ni - San Jose CA, US Abraham C. Ma - Fremont CA, US Ming-Shiang Shen - Taipei, TW
Assignee:
Super Talent Electronics, Inc. - San Jose CA
International Classification:
H01R 13/44
US Classification:
439131
Abstract:
A portable USB device with an improved configuration is described herein. According to one embodiment, a portable USB device includes a core unit having a USB plug connector coupled to one or more multi-level cell (MLC) flash memory devices and an MLC flash controller disposed therein. The portable USB device further includes a housing for enclosing the core unit, including a front end opening to allow the USB plug connector to be deployed. The portable USB device further includes a core unit carrier for carrying the core unit for deploying and retracting the core unit, including a slide button to allow a finger of a user to slide the USB plug connector of the core unit in and out of the housing via the front end opening of the housing.
Western Digital
Principal Failure Analysis Engineer, Data Scientist - Machine Learning
Sandisk Mar 2016 - Aug 2016
Senior Failure Analysis Engineer
Arizona State University Sep 1, 2012 - Nov 2015
Ra
Iowa State University Aug 2010 - May 2012
Ra
University of Florida Jun 2011 - Jul 2011
Ra
Education:
Arizona State University 2012 - 2016
Doctorates, Doctor of Philosophy, Electronics, Electronics Engineering, Philosophy
Iowa State University 2010 - 2012
Masters, Materials Science
Skills:
Matlab Materials Science Characterization Microsoft Office Mathematica Autocad Physics Photolithography Thin Films C++ Scanning Electron Microscopy Nanotechnology Chemistry Simulations Etching Research Labview Sem Tem Afm Xrd Mask Design Depositions Edx Memory Test Python Micro Ionic Switches Programmable Metallization Cell Conductive Bridging Ram Tensor Flow Machine Learning Tensorflow Keras Caffe
ForgeLife since Mar 2010
Co-founder
CIGNEX Technologies, Inc. Apr 2010 - Oct 2010
Senior Liferay Architect, Independent Contractor
CIGNEX Technologies, Inc. Dec 2009 - Oct 2010
Portal Architect, Independent Contractor
InterComponentWare, Inc. Dec 2007 - Dec 2009
Sr. Software Engineer
Pay By Touch Jul 2006 - Dec 2007
Sr. Portal Engineer
Education:
University of Alabama at Birmingham 1995 - 2000
M.S., Computer & Information Sciences; Ph.D. candidate in Biochemistry and Molecular Genetics
Nanjing University
B.S., Biological Sciences
Skills:
OOP CMS Open Source Project Management Agile Methodologies Portals Liferay Vignette Portlets Amazon EC2 Startup Development healthcare IT Web Development Agile Project Management Start-ups Cloud Computing Enterprise Content Management Architecture Software Development Pre-sales Healthcare Information Technology Integration
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Storage Device Architect at Dell Past: Senior Manager at Dell, Lead Development Engineer at Dell, Supplier Quality Engineer at... Engineering professional with 14 years in Storage subsystem/PC industry and 4 years in hybrid surface mount industry. Experienced with managing engineering... Engineering professional with 14 years in Storage subsystem/PC industry and 4 years in hybrid surface mount industry. Experienced with managing engineering personnel, international projects, customer, OEM, ODM and vendor management.
Specialties:
PC, Server and Storage RAID subsystem...