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Garry C Kunselman

age ~76

from Stow, MA

Also known as:
  • Garry S Kunselman
  • Gary C Kunselman
Phone and address:
52 Saw Mill Rd, Stow, MA 01775
(978)8976927

Garry Kunselman Phones & Addresses

  • 52 Saw Mill Rd, Stow, MA 01775 • (978)8976927
  • 23 Tupper Ave, Sandwich, MA 02563
  • Clewiston, FL
  • 52 Saw Mill Rd, Stow, MA 01775

Work

  • Position:
    Sales Occupations

Education

  • Degree:
    High school graduate or higher

Emails

Us Patents

  • Analysis System

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  • US Patent:
    55216986, May 28, 1996
  • Filed:
    Jan 23, 1995
  • Appl. No.:
    8/377127
  • Inventors:
    Charles E. Carroll - Kingston NH
    Garry C. Kunselman - Stow MA
    Arthur E. Tobey - Salem NH
    Richard J. Belmore - East Bridgewater MA
  • Assignee:
    Thermo Jarrell Ash Corporation - Franklin MA
  • International Classification:
    G01N 2100
    G01N 2167
  • US Classification:
    356 70
  • Abstract:
    An analytical system for analyzing a liquid sample that includes structure defining an analysis region with an inlet and an outlet, a spectrometer system disposed in sensing relation to the analysis region, structure defining a sample inlet port, and structure connecting the sample inlet port to the inlet of the analysis region. The analysis region includes sample excitation apparatus with a pair of spaced metal electrodes, one of the electrodes having an upper surface in spaced juxtaposition to the other electrode and passage structure connected to the inlet of the analysis region, and the other electrode having a lower surface of annular configuration in spaced juxtaposition to the upper surface of the one electrode. The one metal electrode is disposed with the passage structure extending to an outlet port in its upper surface, and that electrode includes structure in the upper surface defining a plurality of channels extending away from the outlet port for discharge of excess quantities of a liquid sample to be analyzed that has been flowed through the passage structure. Control structure flows a sample to be analyzed from the sample inlet port through the analysis region, and output structure responsive to the spectrometer system provides output data as a function of the liquid sample flowed into the sample excitation apparatus.
  • Scanning Monochromator System With Direct Coupled Dispersing Element-Electromagnetic Drive Transducer Assembly

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  • US Patent:
    44694415, Sep 4, 1984
  • Filed:
    Mar 4, 1982
  • Appl. No.:
    6/354725
  • Inventors:
    John A. Bernier - Lexington MA
    Garry C. Kunselman - Stow MA
    Karl W. Kaltenbach - Newtonville MA
  • Assignee:
    Allied Corporation - Morristown NJ
  • International Classification:
    G01J 318
    G01N 2173
  • US Classification:
    356316
  • Abstract:
    A scanning monochromator system comprises a housing, structure defining entrance and exit apertures, and a radiation dispersing component in the housing arranged to disperse radiation passing through the entrance aperture into a spectrum for transmission towards the exit aperture. The dispersing element is directly coupled to an electromagnetic drive transducer with the assembly of a rotary component of the drive transducer and the dispersing component being mounted for rotation as a unit about a stationary axis that is perpendicular to the optical axis of the system so that a selected portion of the radiation dispersed by the dispersing component is passed through the exit aperture. The drive transducer is arranged to move a selected portion of dispersed radiation at the exit aperture over a wavelength range of at least 3000 angstroms with a reproducible accuracy of better than 0. 03 angstroms in less than one second.
  • Analysis System

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  • US Patent:
    56107064, Mar 11, 1997
  • Filed:
    Feb 2, 1994
  • Appl. No.:
    8/191395
  • Inventors:
    Charles E. Carroll - Kingston NH
    Garry C. Kunselman - Stow MA
    Arthur E. Tobey - Salem NH
  • Assignee:
    Thermo Jarrell Ash Corporation - Franklin MA
  • International Classification:
    G01N 2167
    G01N 2135
    G01N 3326
  • US Classification:
    356 70
  • Abstract:
    An analytical system for analyzing a liquid sample includes structure defining an analysis region with an inlet and an outlet, a polychromator system disposed in sensing relation to the analysis region, structure defining a sample inlet port, and structure connecting the sample inlet port to the inlet of the analysis region. The analysis region includes sample excitation apparatus with a pair of spaced metal electrodes, one of the electrodes having an upper surface in spaced juxtaposition to the other electrode and passage structure connected to the inlet of the analysis region. The one metal electrode is disposed with the passage structure extending to an outlet port in the upper surface, and structure in the upper surface defines a plurality of channels extending away from the outlet port of the passage structure for discharge of excess quantities of a liquid sample to be analyzed flowed through the passage structure. Control structure flows a sample to be analyzed from the sample inlet port through the analysis region, and output structure coupled to the analysis region provides output data as a function of the output of the polychromator system.
  • Spectroscopic Analysis

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  • US Patent:
    54367239, Jul 25, 1995
  • Filed:
    Mar 5, 1993
  • Appl. No.:
    8/027209
  • Inventors:
    Garry C. Kunselman - Stow MA
    Richard L. Crawford - Attleborough MA
  • Assignee:
    Thermo Jarrell Ash Corporation - Franklin MA
  • International Classification:
    G01J 336
    G01J 330
  • US Classification:
    356307
  • Abstract:
    A spectroanalytical system with radiation dispersing apparatus for dispersing radiation into a spectrum for concurrent application to an array of exit ports; sample excitation apparatus for exciting sample material to be analyzed to spectroemissive levels for generating a beam of radiation for dispersion by the dispersing structure; the exit port array including a corresponding array of detectors including a first detector positioned adjacent a first exit port positioned to sense first order radiation from an element of interest and a second detector positioned adjacent a second exit port to sense second order radiation from the same element of interest; and processing apparatus for responding to outputs of the first and second detectors to provide a compensated output as a function of the quantity of the element of interest in the sample material.
  • Spectrometer Assembly With Post Disperser Assembly

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  • US Patent:
    53432894, Aug 30, 1994
  • Filed:
    Jul 20, 1993
  • Appl. No.:
    8/093899
  • Inventors:
    Richard L. Crawford - Attleborough MA
    Garry C. Kunselman - Stow MA
    Albert Angelucci - Billerica MA
    Bruce C. Fitz-Patrick - Franklin MA
    Richard S. Ferreira - North Dighton MA
  • Assignee:
    Thermo Jarrell Ash Corporation - Waltham MA
  • International Classification:
    G01J 320
  • US Classification:
    356328
  • Abstract:
    A spectrometer system with structure defining an entrance aperture, dispersing structure, structure defining a plurality of exit apertures, detector structure associated with each exit aperture and a post disperser assembly disposed between an exit aperture and its detector structure.
  • Analysis

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  • US Patent:
    54951070, Feb 27, 1996
  • Filed:
    Apr 6, 1994
  • Appl. No.:
    8/223980
  • Inventors:
    Ke Hu - Franklin MA
    Garry C. Kunselman - Stow MA
    Carrol J. Hoffman - Westwood MA
  • Assignee:
    Thermo Jarrell Ash Corporation - Franklin MA
  • International Classification:
    G01N 2117
  • US Classification:
    150281
  • Abstract:
    An analysis system includes induction coupled plasma apparatus into which sample material to be analyzed is introduced for excitation in the plasma, optical measuring apparatus coupled to the induction coupled plasma apparatus for analyzing the sample material, and mass spectrometer apparatus also coupled to the induction coupled plasma apparatus for analyzing the sample material. The mass spectrometer apparatus includes structure defining a first region, a sampling member adjacent the induction coupled plasma apparatus that has an orifice through which at least some ions characteristic of the sample material may pass into the first region, structure defining a second region, and a gate valve between the first and second regions. The gate valve is open when the analysis system is operating in mass spectrometer mode, and is closed when the system is operating only in optical measuring mode. Inert gas is flowed outwardly through the sampling member orifice towards the induction coupled plasma apparatus from the first region of the mass spectrometer when the analysis system is operating in the optical measuring mode.

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