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Gerald I Buckson

Deceased

from Newark, DE

Also known as:
  • Gerald L Buckson
  • Jerald Irving Buckson

Gerald Buckson Phones & Addresses

  • Newark, DE
  • Wilmington, DE

Us Patents

  • Method And Apparatus For Optically Inspecting Cylindrical Articles

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  • US Patent:
    42036739, May 20, 1980
  • Filed:
    Jan 26, 1978
  • Appl. No.:
    5/872499
  • Inventors:
    Gerald I. Buckson - Wilmington DE
  • Assignee:
    E. I. Du Pont de Nemours and Company - Wilmington DE
  • International Classification:
    G01N 2148
  • US Classification:
    356446
  • Abstract:
    The inspection of a cylindrical article is accomplished by scanning the surface of the article in a plane transverse to its longitudinal axis with a light beam sequentially reflected from mirrors spaced about the periphery of the article. Light that is reflected or scattered from the article's surface is detected by sensors which are symmetrically positioned on either side of the scanning plane. Intensity variations and time variations of the sensor signals thus produced are processed to extract information concerning the article's surface uniformity, cross sectional shape, longitudinal shape and length as the article is moved along its longitudinal axis through the inspection plane. An apparatus is also described for effecting such a method. The apparatus uses a rotating polygonal mirror scanner, a plurality of fixed mirrors positioned in the scanning plane peripherally around the article to be inspected and annular sensors positioned fore and aft of the scanning plane through which the articles pass.
  • Apparatus For Web Defect Detection Including A Web Swatch That Contains A Defect

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  • US Patent:
    39708578, Jul 20, 1976
  • Filed:
    Aug 6, 1975
  • Appl. No.:
    5/602466
  • Inventors:
    Gerald Irving Buckson - Wilmington DE
  • Assignee:
    E. I. Du Pont de Nemours and Company - Wilmington DE
  • International Classification:
    G01N 2132
  • US Classification:
    250563
  • Abstract:
    An improved web scanning inspection system that includes a fixed standard web swatch containing representative objectionable defects in the path of the scan beam at the onset of each scan in order to calibrate inspection system discriminator thresholds. Gating and logic circuits are arranged to extract amplitude and duration characteristics of the defect related portions of the signals generated by scans across the standard swatch material. These are then used to actuate an alarm whenever the inspection system discriminator circuits fail to detect the objectional defects in the standard web swatch.

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