Gilberto Corte Trevino

US Patent:

20040019443, Jan 29, 2004

Filed:

Jun 18, 2003

Appl. No.:

10/465064

Inventors:

Keith Jones - Irvine CA, US
Gilberto Sada Trevino - Irvine CA, US
Ragnar Jonsson - Reykjavik, IS
William Jones - Aliso Viejo CA, US

International Classification:

G01R029/02
G01R025/00

US Classification:

702/079000

Abstract:

A method and system for performing sequence time domain reflectometry over a communication channel to determine the location of line anomalies in the communication channel is disclosed. In one embodiment, the system generates a sequence signal and transmits the sequence signal over an optical channel. The system receives one or more reflection signals over the optical channel and performs reflection signal processing on the reflection signal. In one embodiment, the optical reflection is transformed to an electrical signal and correlated with the original sequence signal to generate a correlated signal. The time between the start of the reflection signal and a subsequent point of correlation and the rate of propagation reveals a line anomaly location. A circulator, beam splitter, or any other similar device may direct the reflection signal to the apparatus configured to perform reflection signal processing.

US Patent:

20040044489, Mar 4, 2004

Filed:

Jun 18, 2003

Appl. No.:

10/464962

Inventors:

Keith Jones - Irvine CA, US
Gilberto Sada Trevino - Irvine CA, US
Maurice Reintjes - Beverton OR, US
William Jones - Aliso Viejo CA, US
Ragnar Jonsson - Reykjavik, IS

International Classification:

G06F019/00

US Classification:

702/079000

Abstract:

A method and system for performing sequence time domain reflectometry over a communication channel to determine the location of line anomalies in the communication channel is disclosed. In one embodiment, the system generates a sequence signal and transmits the sequence signal over an optical channel. The system receives one or more reflection signals over the optical channel and performs reflection signal processing on the reflection signal. In one embodiment, the optical reflection is transformed to an electrical signal and correlated with the original sequence signal to generate a correlated signal. The time between the start of the reflection signal and a subsequent point of correlation and the rate of propagation reveals a line anomaly location. In one or more embodiments sequence signal time domain reflectometry occurs during data transmission.

US Patent:

20040257253, Dec 23, 2004

Filed:

Jun 18, 2003

Appl. No.:

10/464963

Inventors:

Keith Jones - Irvine CA, US
Gilberto Isaac Trevino - Irvine CA, US
William Jones - Aliso Viejo CA, US

International Classification:

H03M003/00
H03H007/40

US Classification:

341/143000, 375/232000

Abstract:

A method and apparatus is disclosed for adaptively determining threshold values in a decision device, such as a decision slicer. In one embodiment, a slicer receives one or more updated threshold values during operation to adaptively accommodate changes in the received signal or the channel that may occur over time. The updated threshold value is based on a MIN value and a MAX value. The MIN values represent a-value related to a recently received input that was determined to qualify for a particular slicer output and was less than the particular slicer output value. The MAX values represent a value related to a recently received input that was determined to qualify for a particular slicer output and was greater than the particular slicer output value. In one embodiment, the MAX and MIN value computation is based on scaling factors that dampen the rate of change of the threshold value.