Guy M Vanzo

US Patent:

20050188287, Aug 25, 2005

Filed:

Feb 25, 2004

Appl. No.:

10/708342

Inventors:

Michael Combs - Essex Junction VT, US
Dale Grosch - Burlington VT, US
Toshiharu Saitoh - South Burlington VT, US
Guy Vanzo - Westford VT, US

Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY

International Classification:

G11C029/00

US Classification:

714718000

Abstract:

A method of testing and repairing an integrated circuit having a total number of fuses for effecting repair of the integrated circuit. The method including: testing a memory array with a set of tests and reserving a first number of the total number of fuses for use in repairing the memory array based on results of the first set of tests; and shmoo testing the memory array by incrementing, decrementing or incrementing and decrementing values of a test parameter until a minimum or maximum value of the test parameter is reached that utilizes a second number of the total number of fuses for use in repairing the memory array to operate at the minimum or maximum value of the test parameter.