Harold L Schenk

US Patent:

45530955, Nov 12, 1985

Filed:

Jun 10, 1982

Appl. No.:

6/387051

Inventors:

Harold L. Schenk - Monroeville PA
Warren R. Junker - Monroeville PA

Assignee:

Westinghouse Electric Corp. - Pittsburgh PA

International Classification:

G01B 710
G01R 3312

US Classification:

324230

Abstract:

An eddy current thickness probe for measuring the thickness of a weakly ferromagnetic material layer on a ferromagnetic base is provided with an essentially constant magnetic field bias. The magnetic field bias is of sufficient strength to substantially saturate ferromagnetic constituents in the weakly ferromagnetic layer. This eliminates any effects of changes in permeability of the weakly ferromagnetic layer which would otherwise impair the operation of an eddy current thickness gauge.