Hideharu F Furukawa

US Patent:

6548924, Apr 15, 2003

Filed:

May 30, 2001

Appl. No.:

09/870064

Inventors:

Hideharu Furukawa - Plainville MA
Yoshihiko Ishikawa - Tokyo, JP
Toshio Shimada - Fujioka-machi, JP
Wataru Sugawara - Oohira-machi, JP

Assignee:

Texas Instruments Incorporated - Dallas TX
Hitachi, Ltd. - Tokyo

International Classification:

H02K 1100

US Classification:

310 68C, 310 71, 361 22, 361104, 439622

Abstract:

A protective device ( ) for a hermetic type electromotively driven compressor ( ) includes a protector assembly ( ) having a housing ( ) with an electric current fuse ( ) which detects a predetermined over-current. The housing ( ) comprises an electrically insulating skirt member ( ) formed so as to block a conductive part on the side facing an external connection terminal. By forming the electrically insulating skirt member ( ) of housing ( ) for a hermetic type electromotively driven compressor, insulation distance between a conductive part such as the electric current fuse ( ) and an external conductive part such as a metal wall part ( ) is set to be 9. 5 mm or more.

US Patent:

7988500, Aug 2, 2011

Filed:

Dec 16, 2009

Appl. No.:

12/639183

Inventors:

Hideharu Furukawa - Norton MA, US
Haruhiko Endoh - Oyama-cho, JP

Assignee:

Sensata Technologies Massachusetts, Inc. - Attleboro MA

International Classification:

H01R 13/40

US Classification:

4397331, 439 66, 439 83

Abstract:

A socket apparatus comprises a base portion defining an array of contact cavities. A plurality of contacts are inserted into the array of contact cavities defined in the base portion. The base portion includes a top side and a bottom side and a plurality of ribs extending from the bottom side. Each rib defines at least one sidewall that engages with an anchor of a contact to securely mount the contact. Each contact includes a mounting portion having a first anchor and a second anchor extending from the mounting portion and operable to engage a mounting surface of the base portion to securely mount the contact. The first anchor provides a first anchor force for the contact to the base portion that is substantially greater than a second anchor force provided by the second anchor to the base portion.

US Patent:

59034181, May 11, 1999

Filed:

Feb 24, 1998

Appl. No.:

9/028722

Inventors:

Keith F. Boivin - South Attleboro MA
Hideharu Furukawa - Attleboro MA
Radi Pejouhy - Wolfeboro NH

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H02H7/00

US Classification:

361 22

Abstract:

Motor protection for air conditioning and refrigeration compressors includes in a first embodiment a cluster block (22) having a seat for a hermetic motor protector (24, 24') and mounting a combination terminal/fusible link (26/26d, 26d') in which the motor protector and combination terminal/fusible link can be exposed to cooling fluid contained in the compressor container and the cluster block is mounted on a lead-through pin (18a) of a header (18) in the container wall. In a second embodiment the cluster block (30) is mounted on all three pins (18a, 18b, 18c) of header (18) with pin connectors received in parallel extending channels (30a, 30b, 30c) of the cluster block. In another embodiment the cluster block (40) is irregular in configuration in order to accommodate available space in certain compressor containers and has a lid (40g) to enclose the motor protector. In another embodiment a base member (52) is tied directly to the stator winding and has a snap-on member (58) to capture the motor protector (24) in the motor protector seat.

US Patent:

20210156906, May 27, 2021

Filed:

Nov 25, 2019

Appl. No.:

16/694011

Inventors:

- Attleboro MA, US
Hideharu Furukawa - Norton MA, US

Assignee:

SENSATA TECHNOLOGIES, INC. - Attleboro MA

International Classification:

G01R 31/28

Abstract:

A test socket assembly for a semiconductor device used for burn-in testing comprising a base assembly, a floating plate coupled to the base assembly, and a latch assembly mounted on the floating plate for the retention and movement of the semiconductor device. The base assembly further includes a pin assembly for electrically coupling to the semiconductor device for burn-in testing and at least two upstanding flex arms. In addition, the floating plate and the latch assembly move to a test position for accommodating a varying height of the semiconductor device when mating with a test fixture while the latch still effectively retains the semiconductor device. Lastly, the floating plate is held in a fixed load position due to the support provided by the upstanding flex arms when inserting the semiconductor device into the test socket.