Enrico C. Quintana - Albuquerque NM, US Kyle R. Thompson - Albuquerque NM, US David G. Moore - Albuquerque NM, US Jack D. Heister - Albuquerque NM, US Richard W. Poland - Aiken SC, US John P. Ellegood - Aurora CO, US George K. Hodges - Arab AL, US James E. Prindville - Lincoln CA, US
International Classification:
H05G 1/02
US Classification:
378204
Abstract:
An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.
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