James M Fry

US Patent:

6678634, Jan 13, 2004

Filed:

Apr 27, 2001

Appl. No.:

09/844467

Inventors:

John F. Wendt - Columbus OH
Ulrich Lang - Upper Arlington OH
Leeman D. Spradlin - Columbus OH
Ronald N. Geiger - Columbus OH
James Ronald Fry - Columbus OH
Stephen J. Kiernan - Columbus OH

Assignee:

Automation and Control Technology, Inc. - Columbus OH

International Classification:

G06F 900

US Classification:

702170, 702162, 702179, 702188

Abstract:

A system and method for frequent and accurate measuring of flat sheet thickness on a process line is disclosed. The results of the monitoring process of the present invention may be used to adjust the production process to better remain within predetermined tolerances. Data collection, data analysis, and process control are accomplished using a plurality of software applications in communication with various devices and equipment that support these functions of the present invention. A source/dectector unit collects data during the production process. The data is transmitted, manipulated, analyzed, and compared for conformance to tolerances and error signal output is transmitted to a process control system used to control the production process. If the sheet product is outside a specified tolerance range, an operator may also be notified so that corrective actions can be taken. Software applications may be used by an operator to perform setup and configuration operations.