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Jason T Varricchione

age ~50

from Williston, VT

Also known as:
  • Jason E
Phone and address:
570 Hanon Dr, Saint George, VT 05495
(802)8780866

Jason Varricchione Phones & Addresses

  • 570 Hanon Dr, Williston, VT 05495 • (802)8780866
  • 77 Bayberry Ln, South Burlington, VT 05403 • (802)8651750
  • Essex Junction, VT
  • Fairborn, OH
  • S Burlington, VT

Work

  • Company:
    Qimonda
    2005 to 2008
  • Position:
    Design engineer

Education

  • Specialities:
    Animation, Film

Skills

Cmos • Physical Design • Semiconductors • Circuit Design • Verilog • Electrical Engineering • Dram • Memory Design • Simulation • 3D Animation • Character Animation • Maya • Maya Dynamics

Industries

Semiconductors

Resumes

Jason Varricchione Photo 1

Design Lead

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Location:
570 Hanon Dr, Williston, VT 05495
Industry:
Semiconductors
Work:
Qimonda 2005 - 2008
Design Engineer

Nanya Technology 2005 - 2008
Design Lead

Cypress Semiconductor Corporation 2002 - 2005
Design Engineer

Ibm 1996 - 2002
Design Engineer
Education:
University of Vermont 1992 - 1996
Bachelors, Bachelor of Science, Engineering
Skills:
Cmos
Physical Design
Semiconductors
Circuit Design
Verilog
Electrical Engineering
Dram
Memory Design
Simulation
3D Animation
Character Animation
Maya
Maya Dynamics

Us Patents

  • Dual Slope Temperature Dependent Oscillator

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  • US Patent:
    7173501, Feb 6, 2007
  • Filed:
    May 14, 2004
  • Appl. No.:
    10/845661
  • Inventors:
    Jason Varricchione - Williston VT, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    H03L 1/00
  • US Classification:
    331176, 331 66, 327 83
  • Abstract:
    An oscillator circuit () can provide a dual slop temperature response. For a lower temperature range, a capacitor () can be charged and/or discharged according to a first current source () that provides an essentially constant current source. For a higher temperature range, the capacitor () can be charged and/or discharged according to a second current source () that can be enabled and/or provide current according to a voltage proportional to absolute temperature. A slightly positive temperature coefficient of a first current source () can be offset by a threshold detect circuit ( and ) within a second comparator circuit () that utilizes the threshold voltage (Vt) of a transistor () as a low limit for a capacitor voltage.
  • Electronic System That Adjusts Dll Lock State Acquisition Time

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  • US Patent:
    7728638, Jun 1, 2010
  • Filed:
    Apr 25, 2008
  • Appl. No.:
    12/109609
  • Inventors:
    Jason Varricchione - Williston VT, US
  • Assignee:
    Qimonda North America Corp. - Cary NC
  • International Classification:
    H03L 7/06
  • US Classification:
    327158, 327149
  • Abstract:
    One embodiment provides an electronic system including a delay locked loop and a control circuit. The delay locked loop is configured to be enabled and update lock state data and to be disabled and store the locked state data. The control circuit is configured to periodically enable the delay locked loop in standby mode at an update interval and for an enable period. The control circuit controls the length of the update interval and the length of the enable period to adjust lock state acquisition time for the delay locked loop in exiting the standby mode.
  • Memory Apparatus

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  • US Patent:
    8467254, Jun 18, 2013
  • Filed:
    Sep 25, 2011
  • Appl. No.:
    13/244609
  • Inventors:
    Jason Varricchione - Williston VT, US
    Stephen Potvin - Winooski VT, US
  • Assignee:
    Nanya Technology Corporation - Taoyuan
  • International Classification:
    G11C 7/06
  • US Classification:
    36518907, 36518905, 365191, 365194
  • Abstract:
    A memory apparatus includes a mimic redundant device comparator, a reference delay signal generator, and a signal comparison controller. The mimic redundant device comparator is configured to receive an input signal and to delay the input signal according to a mimic delay, so as to generate a comparison signal. The reference delay signal generator is configured to receive the input signal and to delay the input signal according to a plurality of reference delays, so as to generate a plurality of reference delay signals. The signal comparison controller is configured to receive the reference delay signals and the comparison signal. According to a time difference between the comparison signal and the reference delay signals, the signal comparison controller is configured to generate a selected signal and to generate a delay control signal according to the selected signal.
  • System And Method For Improving Dram Single Cell Fail Fixability And Flexibility Repair At Module Level And Universal Laser Fuse/Anti-Fuse Latch Therefor

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  • US Patent:
    20020196693, Dec 26, 2002
  • Filed:
    Jun 25, 2001
  • Appl. No.:
    09/891025
  • Inventors:
    Claude Bertin - South Burlington VT, US
    John Atkinson - Underhill VT, US
    Nicholas Van Heel - Eagle ID, US
    Jason Varricchione - South Burlington VT, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G11C005/00
  • US Classification:
    365/225700
  • Abstract:
    A universal fuse latch device comprises a latch circuit receiving a precharge signal and latching the precharge signal at a latch node thereof for initializing the latch to a first state; and one or more legs connected at the latch node, with a first leg implementing a fuse type element capable of transitioning the latch from the first state to a second state, and a second leg including an anti-fuse type element, wherein the fuse latch is provided with a fuse resistance trip point to ensure adequate programming of one of the fuse and anti-fuse type element. In one application, the universal fuse latch device is implemented as part of a programmable fuse bank comprising a plurality of information fuse latches for storing redundancy information in a memory system and capable of being simultaneously interrogated. A master fuse control device comprising the universal fuse latch circuit is provided that is programmed in accordance with a priority of legs to be interrogated in the information fuse latches. The system and method of the invention implements logic circuits and devices for determining the priority of legs that are to be interrogated for accessing the redundancy information and for generating appropriate interrogation strobe and leg selection signals to enable proper interrogation of the information fuse latches according to the determined priority.
  • Method And Apparatus For Encoding Data

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  • US Patent:
    20090122856, May 14, 2009
  • Filed:
    Nov 8, 2007
  • Appl. No.:
    11/936829
  • Inventors:
    Robert BAXTER - Chapel Hill NC, US
    Roland BARTH - Ottobrunn, DE
    Steve BOWYER - Raleigh NC, US
    Jonghee HAN - Cary NC, US
    Harald LORENZ - South Burlington VT, US
    Jason VARRICCHIONE - Williston VT, US
    Thomas VOGELSANG - Jericho VT, US
  • International Classification:
    H03K 7/04
  • US Classification:
    375239
  • Abstract:
    A method and apparatus for reducing the number of DQ pins and current used to access data in a memory system or data transfer device, wherein an additional bit is temporally encoded on a data word during a singular access cycle. During an access cycle, the pulse level or levels of encoded bits may determine one or more bits values in a data word being expressed, while the pulse/pulses position in time within a data access cycle determines the remaining bits.

Classmates

Jason Varricchione Photo 2

Jason Varricchione

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Schools:
Essex Middle School Essex Junction VT 1992-1996
Community:
Brian Ingersoll, Michael Willard, Justin Zabrosky, Jeremy Henderson
Jason Varricchione Photo 3

Essex Middle School, Esse...

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Graduates:
Jason Varricchione (1992-1996),
Timothy Raymond Clemens (1998-2002),
Elizabeth Duncan (1997-2001),
Erin K Derry (1992-1996),
Helen Fanton (1961-1965)

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