Jeffrey N Bibbee

US Patent:

6711514, Mar 23, 2004

Filed:

May 22, 2000

Appl. No.:

09/576330

Inventors:

Jeffrey N. Bibbee - Plano TX

Assignee:

Pintail Technologies, Inc. - Plano TX

International Classification:

G01N 3700

US Classification:

702 84, 702 81, 702 82, 702182

Abstract:

Method, apparatus and product for analyzing a quality control regimen comprising one or more quality control tests, to determine if the tests are in statistical control, and therefore could be removed from the regimen or sampled at a different rate. On sample data relating to each of the tests, there is determined C , a measure of the spread of the data, which is simply the ratio of the magnitude of the actual range of the data, to the magnitude of calculated statistical range of the data. There is also determined C , which is a measure of how close the spread of the data is to the upper or lower limit of the data. For convenience, the magnitude of C is represented as a vertical bar graph, with the value of C shown as a position of the bar graph within normalized limits. Using and C decisions regarding removal of each the test can be made. One or more tests are then selected for removal or to have a different sampling rate, and âWhat Ifâ scenarios then performed to see how the testing regimen would have performed without the test(s) or at the different sampling rate.