Jeffrey J York

US Patent:

20100153168, Jun 17, 2010

Filed:

Jun 22, 2009

Appl. No.:

12/489313

Inventors:

Jeffrey York - San Ramon CA, US
Marc Siegel - Dedham MA, US
Albert Ho - Westford MA, US
Christopher Tossing - Waltham MA, US
Adam Ierymenko - Jamaica Plain MA, US
Daniar Hussain - Cambridge MA, US

International Classification:

G06Q 10/00
G01C 21/00
H04Q 5/22

US Classification:

705 9, 705 8, 705 7, 701213, 705 28, 340 101

Abstract:

The present invention is a system and method for inspections and compliance verification of industrial equipment using a handheld device. An inspector first segments an inspected component into logical inspection points. The inspector then scans a unique machine-readable tag, such as an RFID tag, with a handheld device at each logical inspection point. The inspector then takes a media sample, such as a digital photograph, of the physical component referred to by each corresponding logical inspection point. Then the inspector associates the media samples with the corresponding scan of the unique machine-readable tag. For each of the actions the inspector carries out on the handheld device, a timestamp is added that represents evidence of a date and a time of physical visitation to the associated logical inspection point. The inspector may then annotate the media samples in such ways that substantiate inspector statements of problems with inspected components found during inspection.