Ji I Wang

US Patent:

6654711, Nov 25, 2003

Filed:

Jun 15, 1999

Appl. No.:

09/333721

Inventors:

Ji Wang - Sunnyvale CA
Jiun-Der Yu - Mountain View CA
Tsutomu Imai - Suwa, JP

Assignee:

Seiko Epson Corporation - Tokyo

International Classification:

G06F 1750

US Classification:

703 13, 703 14, 703 2, 703 7

Abstract:

Techniques are provided for determining certain correction factors and using these correction factors in analyzing the vibration frequency characteristics of a piezoelectric material. The correction factors are developed based on the Mindlin plate theory and are introduced to correct the inaccuracies of higher-order thickness-shear cut-off frequencies. The analysis is preferably carried out during the design of a piezoelectric device incorporating the piezoelectric material and before production of the piezoelectric device. The design state may also include determining whether the device and its electrodes exhibit appropriate stiffness characteristics.

US Patent:

6658376, Dec 2, 2003

Filed:

Nov 30, 1999

Appl. No.:

09/451381

Inventors:

Ji Wang - Milpitas CA
Jiun-Der Yu - Mountain View CA
Tsutomu Imai - Nagano-ken, JP

Assignee:

Seiko Epson Corporation - Tokyo

International Classification:

G06F 1750

US Classification:

703 13, 703 2, 703 4, 703 6, 703 7, 703 14

Abstract:

An apparatus and method for determining certain correction factors in analyzing the vibration frequency characteristics of an electroded crystal plate. The developed correction factors are introduced to correct the inaccuracies of third-order thickness-shear cut-off frequencies. The analysis is preferably carried out during the design of a piezoelectric device incorporating the electroded crystal plate before production of the device.

US Patent:

7138420, Nov 21, 2006

Filed:

Aug 1, 2003

Appl. No.:

10/632888

Inventors:

Joerg Martin Bentzien - White Plains NY, US
Brian Nicholas Cook - Danbury CT, US
Charles Cywin - Bethel CT, US
Roman Wolfgang Fleck - Greenwich CT, US
Ho Yin Lo - Bethel CT, US
Peter Allen Nemoto - Southbury CT, US
Steven S. Pullen - Danbury CT, US
Gregory Paul Roth - Woodstock CT, US
Roger John Snow - Danbury CT, US
Hidenori Takahashi - LaGrangeville NY, US
Ji Wang - Danbury CT, US
Kevin J. Moriarty - East Norriton PA, US
Lei Qiao - Downingtown PA, US
Michael Winters - Morgantown PA, US

Assignee:

Boehringer Ingelheim Pharmaceuticals Inc. - Ridgefield CT

International Classification:

A61K 31/4184
C07D 235/30

US Classification:

514388, 5483047, 5483074, 548248, 5462734, 544121, 544132, 544370, 514378, 514338, 5142345, 51425406

Abstract:

Disclosed are substituted benzimidazole compounds of formula (I):.

US Patent:

20050209284, Sep 22, 2005

Filed:

Feb 9, 2005

Appl. No.:

11/055798

Inventors:

Joerg Bentzien - White Plains NY, US
Brian Cook - Danbury CT, US
Xiang Li - New Milford CT, US
Ho Lo - Bethel CT, US
Chuk Man - Ridgefield CT, US
Ingo Mugge - New Haven CT, US
Peter Nemoto - Southbury CT, US
Steven Pullen - Danbury CT, US
Doris Riether - New York NY, US
Gregory Roth - Woodstock CT, US
Fariba Soleymanzadeh - Brewster NY, US
Hidenori Takahashi - LaGrangeville NY, US
Ji Wang - Danbury CT, US
Andre White - Newtown CT, US
Renee Zindell - New Milford CT, US

Assignee:

Boehringer Ingelheim Pharmaceuticals, Inc. - Ridgefield CT

International Classification:

A61K031/4439
A61K031/427
A61K031/422
C07D417/02
C07D413/02
C07D043/02
A61K031/4184

US Classification:

514338000, 514365000, 514374000, 514394000, 546273400, 548181000, 546215000, 548305100, 548307400

Abstract:

Disclosed are compounds of formula(I): wherein Ar, Ar, R, R, R, Rand Xare defined herein. The compounds of the invention inhibit Itk kinase and are therefore useful for treating diseases and pathological conditions involving inflammation, immunological disorders and allergic disorders. Also disclosed are processes for preparing these compounds and to pharmaceutical compositions comprising these compounds.

US Patent:

20130177273, Jul 11, 2013

Filed:

Jul 12, 2011

Appl. No.:

13/809618

Inventors:

Robert R. Alfano - Bronx NY, US
Michael Etienne - Corning NY, US
Giovanni Milione - New York NY, US
Daniel Aloysius Nolan - Corning NY, US
Henry Sztul - New York NY, US
Ji Wang - Painted Post NY, US

Assignee:

Research Foundation of CUNY on behalf of City College - New York City NY
Corning Incorporated - Corning NY

International Classification:

G02B 6/10
G02B 6/024

US Classification:

385 11, 385126, 385115

Abstract:

A multicore optical component and corresponding methods of converting a linearly or circularly polarized Gaussian beam of light into a radially or azimuthally polarized beam of light are provided. The multicore optical component comprises a plurality of birefringent, polarization maintaining elliptical cores. The elliptical cores collectively define an azimuthally varying distribution of major axes where the orientation of the major axis of a given elliptical core is given by φ=(180/N)*n+θ where n is the core number and θ is any angle greater than 0.

US Patent:

62301136, May 8, 2001

Filed:

Dec 16, 1998

Appl. No.:

9/212816

Inventors:

Ji Wang - Mountain View CA
Tsutomu Imai - Nagano-ken, JP

Assignee:

Seiko Epson Corporation - Tokyo

International Classification:

G06F 1750
G06N 700

US Classification:

703 1

Abstract:

A method for verifying the design of piezoelectric devices includes expressing attributes of such piezoelectric device or subsystem thereof in terms of an elastic property or properties of a different subsystem or device component of the piezoelectric device. Such piezoelectric device may include a layer of piezoelectric material and one or more electrodes affixed to one or more faces of such layer. Computational complexity of models of the design are reduced by modeling displacement of the electrodes as being equal to displacement of the layer of piezoelectric material during operation of such piezoelectric device. Further reduction in computational complexity is achieved by modeling electrode displacement as being uniform within each electrode. Stress in the piezoelectric device or subsystem thereof is expressed in terms of elastic properties of a different subsystem of the piezoelectric device. Further any express dependence on strain in a subsystem or device component of the piezoelectric device may be eliminated to reduce model complexity.