Jie Xing C Li

US Patent:

7860870, Dec 28, 2010

Filed:

May 31, 2007

Appl. No.:

11/755972

Inventors:

Narayanan Sadagopan - Fremont CA, US
Jie Li - Stanford CA, US

Assignee:

Yahoo! Inc. - Sunnyvale CA

International Classification:

G06F 17/30

US Classification:

707748, 707758

Abstract:

The present invention provides for the detection of abnormal user behavior for a query session of an electronic search engine. A query session is initiated upon receipt of a user search request that includes one or more search terms. The search engine, in accordance with known search technology, generates a search results page that includes various hyperlinks, including for example web content hyperlinks, page navigation hyperlinks and advertising hyperlinks. Tracking user activities generates the clickstream associated with the search results page. The present invention determines a probability score for the clickstream and then this score is normalized. A comparison of the normalized probability score with other normalized probability scores for similar query sessions determines of the normalcy of the query session.

US Patent:

8170838, May 1, 2012

Filed:

Apr 27, 2009

Appl. No.:

12/430805

Inventors:

Silvio J. Rabello - Palo Alto CA, US
William A. McGahan - Spicewood TX, US
Jie Li - Milpitas CA, US

Assignee:

Nanometrics Incorporated - Milpitas CA

International Classification:

H03F 1/26
G06F 15/00

US Classification:

702189, 359237, 372 24, 600409, 702 27, 702127

Abstract:

The process of modeling a complex two-dimensional periodic structure is improved by selectively truncating the Fourier expansion used in the calculation of resulting scatter signature from the model. The Fourier expansion is selectively truncated by determining the contribution for each harmonic order in the Fourier transform of the permittivity function and retaining the harmonic orders with a contribution that is above a threshold. The Fourier space may be compressed so that only the selected harmonic orders are used, thereby reducing the required memory and calculation times. The compressed Fourier space may be used in a real-time analysis of a sample or to generate a library that is used in the analysis of a sample.

US Patent:

8525993, Sep 3, 2013

Filed:

Jan 29, 2010

Appl. No.:

12/696974

Inventors:

Silvio J. Rabello - Palo Alto CA, US
William A. McGahan - Spicewood TX, US
Jie Li - Milpitas CA, US
Yongdong Liu - Cupertino CA, US

Assignee:

Nanometrics Incorporated - Milpitas CA

International Classification:

G01J 4/00

US Classification:

356368, 356369

Abstract:

Asymmetry metrology is performed using at least a portion of Mueller matrix elements, including, e. g. , the off-diagonal elements of the Mueller matrix. The Mueller matrix may be generated using, e. g. , a spectroscopic or angle resolved ellipsometer that may include a rotating compensator. The Mueller matrix is analyzed by fitting at least a portion of the elements to Mueller matrix elements calculated using a rigorous electromagnetic model of the sample or by fitting the off-diagonal elements to a calibrated linear response. The use of the Mueller matrix elements in the asymmetry measurement permits, e. g. , overlay analysis using in-chip devices thereby avoiding the need for special off-chip targets.

US Patent:

20110238365, Sep 29, 2011

Filed:

Mar 22, 2011

Appl. No.:

13/053584

Inventors:

Jie Li - Milpitas CA, US
Zhuan Liu - Fremont CA, US
Silvio J. Rabello - Palo Alto CA, US
Nigel P. Smith - Hillsboro CA, US

Assignee:

NANOMETRICS INCORPORATED - Milpitas CA

International Classification:

G06F 15/00
G01B 11/00

US Classification:

702150, 356401

Abstract:

An empirical diffraction based overlay (eDBO) measurement of an overlay error is produced using diffraction signals from a plurality of diffraction based alignment pads from an alignment target. The linearity of the overlay error is tested using the same diffraction signals or a different set of diffraction signals from diffraction based alignment pads. Wavelengths that do not have a linear response to overlay error may be excluded from the measurement error.

US Patent:

20120162647, Jun 28, 2012

Filed:

Dec 27, 2010

Appl. No.:

12/978922

Inventors:

Jie Li - Milpitas CA, US

International Classification:

G01B 11/00

US Classification:

356399

Abstract:

A plurality of overlay errors in a structure is determined using a target that includes a plurality of diffraction based overlay pads. Each diffraction based overlay pad has the same number of periodic patterns as the structure under test. Additionally, each diffraction based overlay pad includes a programmed shift between each pair of periodic patterns. The pads are illuminated and the resulting light is detected and used to simultaneously determine the plurality of overlay errors in the structure based on the programmed shifts. The overlay errors may be determined using a subset of elements of the Mueller matrix or by using the resulting spectra from the pads.

US Patent:

20130346219, Dec 26, 2013

Filed:

Jun 25, 2012

Appl. No.:

13/532310

Inventors:

Ye Chen - Sunnyvale CA, US
Pavel Berkhin - Sunnyvale CA, US
Jie Li - Palo Alto CA, US
Xia Sharon Wan - Saratoga CA, US
Tak Yan - Palo Alto CA, US

Assignee:

MICROSOFT CORPORATION - Redmond WA

International Classification:

G06Q 30/02

US Classification:

705 1471

Abstract:

Methods and systems for estimating the value of a contextual ad impression are provided. Requests for value-based bids for ad impressions are received from bidders and the value of the ad impression is estimated based primarily upon leveraging sell-side data (user and publisher). The estimation is highly economized through a fast implementation of k-nearest-neighbor (kNN) regression. Embodiments of the present invention further address the cold-start problem or the exploration vs. exploitation requirement by Bayesian (hierarchical) smoothing using a beta prior, and adapt to the temporal dynamics using an autoregressive model to decay importance of certain data.

US Patent:

20220368773, Nov 17, 2022

Filed:

Jun 10, 2022

Appl. No.:

17/837834

Inventors:

- San Jose CA, US
Akshay Deodhar - San Jose CA, US
Aroosh Sohi - San Jose CA, US
Arpit Singh - San Jose CA, US
Jie Li - San Jose CA, US
Nikhil Bhatia - San Jose CA, US

Assignee:

Nutanix, Inc. - San Jose CA

International Classification:

H04L 67/51
G06F 8/60
G06F 9/54
G06F 9/455
H04L 67/1021

Abstract:

In some aspects, a non-transitory computer-readable storage medium having computer-executable instructions stored thereon that, upon execution by a processor, causes the processor to receive an indicator of a functionality; map the indicator to a first service and a second service dependent on the first service; identify a policy based on the first service and the second service; and determine, based on the policy, locations of deployment for the first service and the second service.

US Patent:

20220309695, Sep 29, 2022

Filed:

Mar 25, 2021

Appl. No.:

17/212325

Inventors:

- Los Altos CA, US
Rares A. Ambrus - San Francisco CA, US
Adrien David Gaidon - Mountain View CA, US
Jie Li - Los Altos CA, US

International Classification:

G06T 7/571
G06T 15/20
G06T 15/40
G06T 3/00

Abstract:

Systems and methods described herein relate to training a machine-learning-based monocular depth estimator. One embodiment selects a virtual image in a virtual dataset, the virtual dataset including a plurality of computer-generated virtual images; generates, from the virtual image in accordance with virtual-camera intrinsics, a point cloud in three-dimensional space based on ground-truth depth information associated with the virtual image; reprojects the point cloud back to two-dimensional image space in accordance with real-world camera intrinsics to generate a transformed virtual image; and trains the machine-learning-based monocular depth estimator, at least in part, using the transformed virtual image.