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Jingping P Peng

age ~78

from San Antonio, TX

Also known as:
  • Jingting P Peng
  • Jing P Peng
  • Peng Jingping

Jingping Peng Phones & Addresses

  • San Antonio, TX
  • Houston, TX
  • 4317 Denham Way, Plano, TX 75024
  • Denton, TX
  • Waco, TX

Work

  • Company:
    A&bb labs
    Oct 2009
  • Position:
    Chemist

Industries

Environmental Services

Resumes

Jingping Peng Photo 1

Chemist

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Location:
Houston, TX
Industry:
Environmental Services
Work:
A&Bb Labs
Chemist

Us Patents

  • Patterned Atomic Layer Epitaxy

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  • US Patent:
    7799132, Sep 21, 2010
  • Filed:
    Dec 13, 2007
  • Appl. No.:
    11/955845
  • Inventors:
    John N. Randall - Richardson TX, US
    Jingping Peng - Plano TX, US
    George D. Skidmore - Richardson TX, US
    Christof Baur - Dallas TX, US
    Richard E. Stallcup - Little Elm TX, US
    Robert J. Folaron - Plano TX, US
  • Assignee:
    Zyvex Labs, LLC - Richardson TX
  • International Classification:
    C30B 25/04
  • US Classification:
    117 84, 117 89, 117 94, 117104, 117105
  • Abstract:
    A patterned layer is formed by removing nanoscale passivating particle from a first plurality of nanoscale structural particles or by adding nanoscale passivating particles to the first plurality of nanoscale structural particles. Each of a second plurality of nanoscale structural particles is deposited on each of corresponding ones of the first plurality of nanoscale structural particles that is not passivated by one of the plurality of nanoscale passivating particles.
  • Patterned Atomic Layer Epitaxy

    view source
  • US Patent:
    20050223968, Oct 13, 2005
  • Filed:
    Mar 25, 2005
  • Appl. No.:
    11/089814
  • Inventors:
    John Randall - Richardson TX, US
    Jingping Peng - Plano TX, US
    George Skidmore - Richardson TX, US
    Christof Baur - Dallas TX, US
    Richard Stallcup - Little Elm TX, US
    Robert Folaron - Plano TX, US
  • Assignee:
    Zyvex Corporation - Richardson TX
  • International Classification:
    C30B023/00
    C30B025/00
    C30B028/12
    C30B029/08
    C30B028/14
  • US Classification:
    117094000, 117091000, 117092000, 117097000, 117104000, 117936000
  • Abstract:
    A patterned layer is formed by removing nanoscale passivating particle from a first plurality of nanoscale structural particles or by adding nanoscale passivating particles to the first plurality of nanoscale structural particles. Each of a second plurality of nanoscale structural particles is deposited on each of corresponding ones of the first plurality of nanoscale structural particles that is not passivated by one of the plurality of nanoscale passivating particles.

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Jingping Peng Photo 2

Jingping Peng


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