Jingxian Wu

US Patent:

20070038413, Feb 15, 2007

Filed:

Aug 15, 2005

Appl. No.:

11/203440

Inventors:

Neelesh Mehta - Medford MA, US
Andreas Molisch - Arlington MA, US
Jingxian Wu - Rohnert Park CA, US
Jinyun Zhang - Cambridge MA, US

International Classification:

G06F 15/00

US Classification:

702189000

Abstract:

A method analyzes a set of signal acquired from a physical system. A set of parameters characterizing the set of signals is measured. The parameters can include the mean and the variance of the power of the signal, and a Rician factor. A first point and a second point of a moment generating function for a combination of the set of signals are evaluated according to the set of parameters to obtain a first sample and a second sample, respectively. First and second equations are defined. The equations respectively have an approximation of a moment generation function of a lognormal random variable representing the combination of the set of signals, at the first point and the second point, on the left side, and the first and second sample on the right side. The two equations are solved to obtain a mean and a variance of the lognormal random variable representing a distribution of the combination of the set of the signals.