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Joe C Wang

age ~53

from Naperville, IL

Also known as:
  • Joe Chii Wang
  • Joe Tracy Limosnero Wang
  • Joe T Wang
  • Joe Chii Tzuu Wang
  • Chii Tzuu Wang
  • Chii C Wang
  • Chii T Wang
  • U Wang
  • Joe Chii Tzuu
Phone and address:
2111 Haider Ave, Naperville, IL 60564
(773)5902000

Joe Wang Phones & Addresses

  • 2111 Haider Ave, Naperville, IL 60564 • (773)5902000
  • Chicago, IL
  • 1932 Gardner Cir, Aurora, IL 60504 • (630)3756708
  • 379 Commerce St, Aurora, IL 60504 • (630)9077246
  • Boiling Springs, SC
  • Northbrook, IL
  • Millbrook, AL

Work

  • Company:
    Williams realty group
  • Address:
    3102 Highway 14, Millbrook, AL 36054
  • Phones:
    (847)8452226
  • Position:
    Partner
  • Industries:
    Real Estate Agents and Managers

Languages

English

Specialities

Chiropractic
Name / Title
Company / Classification
Phones & Addresses
Joe Wang
Partner
Williams Realty Group
Real Estate Agents and Managers
3102 Highway 14, Millbrook, AL 36054
Joe Wang
Developer
Aspen Technology, Inc.
State Commercial Banks
200 Wheeler Rd, Arlington Hts, IL 60005
Joe C. Wang
Dc, President, Principal
Wang Family Chiropractic
Chiropractor's Office
3103 111 St, Naperville, IL 60564
(630)3557001

Medicine Doctors

Joe Wang Photo 1

Dr. Joe C Wang, Naperville IL - DC (Doctor of Chiropractic)

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Specialties:
Chiropractic
Address:
3103 111Th St Suite 121, Naperville, IL 60564
Languages:
English

Us Patents

  • Method Of Separating And Handling A Thin Semiconductor Die On A Wafer

    view source
  • US Patent:
    6772509, Aug 10, 2004
  • Filed:
    Jan 28, 2002
  • Appl. No.:
    10/058650
  • Inventors:
    Shiuh-Hui Steven Chen - Lake Zurich IL
    Cheryl Field - Kildeer IL
    Didier R. Lefebvre - Mundelein IL
    Joe Pin Wang - Long Grove IL
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    H01R 4300
  • US Classification:
    29825, 295646, 29743, 29832, 257678, 257618, 264571
  • Abstract:
    A method of separating a thin die ( ) from a support body ( ) of a semiconductor wafer ( ). The thin die ( ) being initially attached to the support body ( ) by an attachment mechanism ( ). The attachment mechanism may be a plurality of tethers ( ) that extend between the thin die ( ) and the support body ( ). The method may include the steps of: positioning the wafer ( ) on a rigid backing ( ) having a hole ( ), the hole ( ) positioned beneath the thin die ( ); positioning a tip ( ) of a handler ( ) above the thin die ( ), the tip ( ) having a passageway ( ) to a vacuum source; positioning an ejection pin ( ) in a spaced apart relationship beneath the thin die ( ); moving the tip ( ) of the handler ( ) downward toward the thin die ( ) to break the attachment mechanism ( ) and clamp the thin die ( ) between the tip ( ) of the handler ( ) and the ejection pin ( ); and moving the ejection pin ( ) upward in the direction of the tip ( ) of the handler ( ) until the thin die ( ) is extracted from the wafer ( ).
  • Microdevice Assembly Having A Fine Grain Getter Layer For Maintaining Vacuum

    view source
  • US Patent:
    6867543, Mar 15, 2005
  • Filed:
    Mar 31, 2003
  • Appl. No.:
    10/403637
  • Inventors:
    Joe P. Wang - Long Grove IL, US
    Cheryl B. Field - Kildeer IL, US
    Michael Pfeifer - Northbrook IL, US
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    H01J019/70
    H01J009/38
  • US Classification:
    313553, 313481, 313549, 313561
  • Abstract:
    A microdevice assembly () that includes a device microstructure (), a housing (), and a fine grain getter layer (). The housing () has a base portion () and a lid (). The device microstructure () is attached to the base portion () and the lid () is hermetically sealed to the base portion (). The housing () defines a cavity () surrounding the device microstructure (). The fine grain getter layer () is on an interior side () of the lid () for maintaining a vacuum in the cavity () surrounding the device microstructure (). The lid () may be made of metal or have at least a metallic surface in the region where the fine grain getter layer () is applied. The fine grain getter layer () has a sub-micron grain size. There is also a method for making the microdevice assembly ().
  • Strain Gauge

    view source
  • US Patent:
    6427539, Aug 6, 2002
  • Filed:
    Jul 31, 2000
  • Appl. No.:
    09/629270
  • Inventors:
    Shiuh-Hui Steven Chen - Lake Zurich IL
    Yanling Kang - Northbrook IL
    Joe P. Wang - Long Grove IL
  • Assignee:
    Motorola, Inc. - Schaumburg IL
  • International Classification:
    G01L 904
  • US Classification:
    73726
  • Abstract:
    A reliable sensor provides a user-friendly semiconductor sensing device and transducer which accurately detects the characteristics of a fluid, such as pressure and strain, at high temperature operating conditions. The high performance sensor is particularly useful for use with diesel engines and internal combustion engines in vehicles. The sensor can comprise a single die with a transverse strain gauge or a group of strain gauges which are located at a position on the die to help minimize electric effects of thermal stress on the gauges during pressure detection and operation of the vehicle. The die can be glass fused, such as by glass frit, to a diaphragm, such as a stainless steel diaphragm, so as not to readily corrode in the fluid.
  • Pressure Sensor With External Vertical Electrical Interconnection System

    view source
  • US Patent:
    20200182728, Jun 11, 2020
  • Filed:
    Oct 25, 2019
  • Appl. No.:
    16/663851
  • Inventors:
    - Auburn Hills MI, US
    Joe Pin Wang - Deer Park IL, US
    David W. Ivaska - Deer Park IL, US
    Richard E. Cronin - Deer Park IL, US
    Erich Mattmann - Schwalbach, DE
    Frank Langner - Schwalbach, DE
  • Assignee:
    Vitesco Technologies USA, LLC. - Auburn Hills MI
  • International Classification:
    G01L 19/14
    H05K 5/06
    B23K 1/19
    G01L 19/00
    G01L 9/00
  • Abstract:
    A pressure sensor assembly, which includes a support substrate, circuitry mounted to the support substrate, at least one conductor mounted to the support substrate and in electrical communication with the circuitry, and at least one vertically conductive path connected to and in electrical communication with the at least one conductor. The pressure sensor assembly also includes a diaphragm, at least one sealing glass section connected to the diaphragm and the support substrate, and at least one lateral conductive feed-through mounted to the diaphragm. At least one conductive joint is connected to the vertically conductive path and the lateral conductive feed-through, and the conductive joint provides electrical communication between the vertically conductive path and the lateral conductive feed-through.
  • Die Bond Design For Medium Pressure Sensor

    view source
  • US Patent:
    20150091107, Apr 2, 2015
  • Filed:
    Sep 27, 2013
  • Appl. No.:
    14/040167
  • Inventors:
    - Auburn Hills MI, US
    Joe Pin Wang - Long Grove IL, US
  • International Classification:
    B81C 3/00
  • US Classification:
    257415, 438 51
  • Abstract:
    A micro-electromechanical pressure transducer formed from a silicon die centers itself on a pedestal, formed from either a metal or a dielectric, by applying a predetermined amount of liquid epoxy adhesive to the square, top surface of the pedestal and allowing the liquid adhesive to distribute itself over the top surface. A MEMS die placed atop the liquid adhesive is centered on the top surface by surface tension between sides of the die and the top surface.
  • Micro-Electromechanical Pressure Sensor Having Reduced Thermally-Induced Stress

    view source
  • US Patent:
    20140103468, Apr 17, 2014
  • Filed:
    Oct 16, 2012
  • Appl. No.:
    13/652739
  • Inventors:
    - Auburn Hills MI, US
    Joe Pin Wang - Long Grove IL, US
  • Assignee:
    CONTINENTAL AUTOMOTIVE SYSTEMS, INC. - Auburn Hills MI
  • International Classification:
    B81B 3/00
    B81C 3/00
  • US Classification:
    257419, 438 51, 257E29324, 257E21499
  • Abstract:
    Thermally-induced stress on a silicon micro-electromechanical pressure transducer (MEMS sensor) is reduced by attaching the MEMS sensor to a plastic filled with low Cfillers that lowers the plastic's coefficient of thermal expansion (C) to be closer to that of silicon. The MEMS sensor is attached to the housing using an epoxy adhesive/silica filler mixture, which when cured has a Cbetween about ten PPM/ C. and about thirty PPM/ C. in order to match the housing C. The adhesive also has a glass transition temperature (Tg) above the operating temperature range. This design provides good sealing of the sensor and stable sensor outputs.

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Googleplus

Joe Wang Photo 10

Joe Wang

Work:
QiaoXin Furnitures Ind. - G.M
Education:
Chinese Culture University - Physic
Joe Wang Photo 11

Joe Wang

Education:
University of Michigan - Ross School of Business
Joe Wang Photo 12

Joe Wang

Joe Wang Photo 13

Joe Wang

Joe Wang Photo 14

Joe Wang

Joe Wang Photo 15

Joe Wang

Joe Wang Photo 16

Joe Wang

Joe Wang Photo 17

Joe Wang

Youtube

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