Extensive Experience Leading Product Development Teams at Skilled Design/Program Manager
Location:
Reading, Pennsylvania Area
Industry:
Semiconductors
Work:
Skilled Design/Program Manager - Wyomissing, PA since Jan 2013
Extensive Experience Leading Product Development Teams
Microsemi Oct 2011 - Jan 2013
Design Manager
Zarlink Semiconductor - Reading, Pennsylvania Area Aug 2007 - Oct 2011
Design Manager
Legerity Sep 2002 - Aug 2007
Design Manager
Agere Systems Feb 2000 - Sep 2002
Design Manager
Education:
Florida Institute of Technology 1986 - 1988
MS, Engineering Management
Stanford University 1979 - 1984
BSEE/MSEE, Electrical Engineering
Skills:
Analog Analog Circuit Design CMOS IC Mixed Signal Semiconductor Industry BiCMOS VLSI SoC Electronics EDA Semiconductors ASIC Verilog RTL design Integrated Circuit Design Circuit Design Silicon Electrical Engineering Physical Design
Orthopedic Associates AugustaOrthopaedics Associates Of Augusta PA 811 13 St STE 20, Augusta, GA 30901 (706)7223401 (phone), (706)7246540 (fax)
Education:
Medical School Wake Forest University School of Medicine Graduated: 2006
Procedures:
Hip/Femur Fractures and Dislocations Joint Arthroscopy Occupational Therapy Evaluation Spinal Cord Surgery Spinal Fusion Spinal Surgery Arthrocentesis Carpal Tunnel Decompression Hip Replacement Lower Arm/Elbow/Wrist Fractures and Dislocations Lower Leg/Ankle Fractures and Dislocations Shoulder Arthroscopy Shoulder Surgery
Conditions:
Fractures, Dislocations, Derangement, and Sprains Internal Derangement of Knee Cartilage Intervertebral Disc Degeneration Osteoarthritis Plantar Fascitis
Languages:
English
Description:
Dr. Clapp graduated from the Wake Forest University School of Medicine in 2006. He works in Augusta, GA and specializes in Orthopaedic Surgery and Orthopaedic Surgery Of Spine. Dr. Clapp is affiliated with University Hospital.
John S. Clapp - Wyomissing PA Glen A. Johnson - Reading PA Douglas Baird Lebo - Birdsboro PA Lawrence Peter Swanson - Fleetwood PA
Assignee:
Agere Systems Guardian Corp. - Orlando FL
International Classification:
H03M 110
US Classification:
341121, 341144
Abstract:
The present invention provides methods and apparatus for trimming semiconductor devices and circuits, such as pin electronics circuits used in automated test equipment (ATE) systems and the like, without requiring a laser trimming operation. In a preferred embodiment, the present invention addresses the need to precisely adjust a reference current and/or voltage by replacing a conventional current/voltage reference source with a digital-to-analog (D/A) converter. A select switch or mechanism is preferably coupled to the input of the D/A converter and operatively presents a digital input word to the D/A converter by selectively reading the digital word from at least one of a data register and a fuse register. The data register is preferably used during testing of the overall current or voltage reference by iteratively trying various digital input codes while concurrently measuring the analog output signal from the D/A converter until the output signal sufficiently matches a predetermined output value. The fuse register, which comprises a plurality of fusible links, is then preferably blown to permanently store the input code word that provides the desired reference output.
Current Limiter For Magneto-Resistive Circuit Element
John Clapp - Wyomissing PA, US Thanh Nguyen - Temple PA, US
International Classification:
H02H009/00
US Classification:
361/058000, 361/093900
Abstract:
A current limiter circuit for limiting current in an electrical circuit element such as the magneto-resistive portion of a read head forming a portion of a hard disk drive and including: a first circuit connected to one end of the circuit element for applying a bias current of a desired value to the circuit element in response to the value to an input signal; a second circuit connected to the other end of the circuit element for setting the amplitude of the voltage signal generated across the circuit element in response to the bias current; and a third electrical circuit connected to both the first and second circuits for limiting the value of bias current to a predetermined level for an abnormal event such as a current surge, a short circuit, or any other type of undesired current operating condition.
Method And Apparatus For High Voltage Level Shifting
A voltage level shifter circuit (10) for outputting an output high (18) and output low (18) signal is provided which accommodates multiple power supplies (12 and 22) at different relative voltage to each other. The voltage level shifter (10) includes an input stage (24) which is characterized by voltage ranges applicable to the process used to make the circuit. The voltage level shifter circuit includes an output stage (18) which is also characterized by the same voltage ranges which cannot be exceeded. The output stage outputs the translated output high (16) and output low (18) voltage signals. A clamping network (20) is employed to ensure that the output stage voltage ranges are not exceeded. The present invention implements a high voltage level shifter (10) using low voltage components by extending the breakdown capability of the voltage level shifter circuit (10) past the breakdown voltage of any single component in the circuit.
John S. Clapp - Reinholds PA Wayne T. Chen - Plano TX
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G05F 110 H03K 508 H03K 19084
US Classification:
327530
Abstract:
A dynamic biasing circuit is disclosed that includes a blocking current source (20) having a first current path connected to a first node (NODE 1) and a second current path connected to a second node (NODE 3). A linear source follower (22) has a first current path connected to the second node (NODE 3), a second current path connected to a voltage reference (24), and an input connected to the first node (NODE 1). A parasitic capacitor (26) is connected to the first node (NODE 1) and to ground potential, and a parasitic capacitor (28) is connected to the second node (NODE 3) and to ground potential.
Apparatus And Method For Extending The Breakdown Capability Of A Switching Circuit
A circuit (16) having an extended breakdown capability is provided for switching an inductive load driver (12). The circuit (16) includes a first switch (18) for providing a first drive voltage when the first switch (18) is closed. A second switch (20) is provided for receiving the first drive voltage from the first switch (18) and delivering the first drive voltage to the inductive load driver (12) when the second switch (20) is closed. The second switch (20) limits the voltage across the first switch (18) to a predetermined level when the first switch (18) is open. A third switch (22) provides a second drive voltage to the inductive load driver (12) when the third switch (22) is closed.
Elon College High School Elon College NC 1938-1942
Community:
Sam Moorefield, Eudora Thompson, Ray Whitesell, William Petty, Laura Waynick, William Tapscott, Thomas Sharpe, Joan Rivers, Denny Wagoner, Karen Martin, Ann Thomas
Economically, what theyre doing makes sense, John Clapp, professor emeritus of real estate at the University of Connecticut, said of Namdar. Bottom fishing, they get in at a very good price for the amount of real estate theyre getting. They keep the restaurants open, a few stores, then they go