John R Hickman

US Patent:

D4234294, Apr 25, 2000

Filed:

Mar 8, 1999

Appl. No.:

D/101615

Inventors:

John T. Hickman - Sanger TX
David A. Neves - Denton TX
Thomas D. Reed - Denton TX

Assignee:

Paccar Inc - Bellevue WA

International Classification:

1216

US Classification:

D12169

US Patent:

39406105, Feb 24, 1976

Filed:

Feb 15, 1974

Appl. No.:

5/443073

Inventors:

Charles L. Dennis - De Soto TX
Wyatt W. Givens - Dallas TX
John B. Hickman - Grand Prairie TX

Assignee:

Mobil Oil Corporation - New York NY

International Classification:

G01V 500
G01T 120

US Classification:

250253

Abstract:

A borehole logging system employs a gamma-ray detector for measuring the natural gamma radiation of the earth formations surrounding a borehole. Three energy band selectors, each employing a discriminator and count rate meter, separate the output of the gamma-ray detector into potassium, uranium, and thorium energy band signals. A first operational amplifier determines the difference between the potassium energy band signal and those portions of the uranium and thorium energy band signals which represent the influence of uranium and thorium gamma radiation within the potassium energy band, this difference representing the correct potassium gamma radiation. A second operational amplifier determines the difference between the uranium energy band signal and that portion of the thorium energy band signal which represents the influence of the thorium gamma radiation within the uranium energy band, this difference representing the correct uranium gamma radiation. A third operational amplifier determines the difference between the thorium energy band signal and that portion of the uranium energy band signal which represents the influence of the uranium gamma radiation within the thorium energy band, this difference representing the correct thorium gamma radiation.

US Patent:

50124714, Apr 30, 1991

Filed:

Sep 30, 1988

Appl. No.:

7/252289

Inventors:

Theo J. Powell - Dallas TX
John I. Hickman - Cooper TX
Jeri J. Crowley - Garland TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G06F 1110

US Classification:

371 27

Abstract:

An automatic test pattern generator and process assigns value-strength number to selected nodes representing the electrical characteristic strength of integrated circuits including field effect transistors and the logic state values at those nodes. These value-strength numbers become sensitized to the inputs of the selected node and become propagated to outputs of the selected node for establishing patterns for test signals. The test signals later become used in chip testers for determining good and bad integrated circuit chips. The value-strength numbers also become used in dynamic testing of the integrated circuit nodes by using clock signals of the integrated circuit to establish a transition at a start node of a test path. Within a known clock period later, the transition should become captured at an end node of the test path.