John Lin

US Patent:

20090313600, Dec 17, 2009

Filed:

Jun 13, 2008

Appl. No.:

12/138440

Inventors:

Andrew Ayers - Kirkland WA, US
John Lin - Issaquah WA, US
Patrick Sathyanathan - Bellevue WA, US

Assignee:

Microsoft Corporation - Redmond WA

International Classification:

G06F 9/44

US Classification:

717106

Abstract:

A system and method for performing multi-threaded compilation of source code is provided. A representation such as a directed acyclic graph (DAG) may be generated representing functions and their dependency relationships on each other. Code is generated and optimized for each function. The code generation is scheduled, based on the representation, so that multiple functions may be compiled concurrently, while enforcing ordering restrictions to generate code in a deterministic manner. An application executable may be generated that is deterministic, based on the input source code and regardless of variations due to multi-threading.

US Patent:

20130066402, Mar 14, 2013

Filed:

Aug 17, 2012

Appl. No.:

13/588957

Inventors:

John Yu-luen Lin - Del Mar CA, US
Roger Y. Tsien - La Jolla CA, US

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

C07K 19/00
A61N 5/06
C12N 15/864
C12N 15/62
C12N 15/85

US Classification:

607 88, 536 234, 435455, 4353201, 530350

Abstract:

The invention provides engineered red-shifted channelrhodopsin variants. In some embodiments, the channelrhodopsin variants are characterized by improved membrane trafficking, expression, and/or unique spectral and kinetic properties.

US Patent:

20130188858, Jul 25, 2013

Filed:

Jan 20, 2012

Appl. No.:

13/355100

Inventors:

John Z. Lin - Renton WA, US
Hong Tat - Redmond WA, US
Richard H. Bossi - Renton WA, US

International Classification:

G06K 9/00

US Classification:

382141

Abstract:

A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity parameter. The first simulated inspection is conducted using a first evaluation setting. A first image is produced based on the first waveform set, and it is determined whether a quality of the first image satisfies a predetermined threshold.

US Patent:

20200094494, Mar 26, 2020

Filed:

Nov 26, 2019

Appl. No.:

16/696041

Inventors:

- Chicago IL, US
Samuel F. Pedigo - Lake Forest Park WA, US
Sayata Ghose - Sammamish WA, US
John Z. Lin - Renton WA, US

Assignee:

The Boeing Company - Chicago IL

International Classification:

B29C 70/38
B29C 35/08
B29C 35/02

Abstract:

Closed-loop systems and methods for controlling the temperature at the compaction point as an automated fiber placement (AFP) machine is placing material over complex surface features at varying speeds. The closed-loop system starts with multiple infrared temperature sensors directed at the layup surface in front of the compaction roller and also at the new layup surface behind the compaction roller. These sensors supply direct temperature readings to a control computer, which also receives speed data and a listing of active tows from the AFP machine and is also programmed with the number of plies in the current layup. In accordance with one embodiment, the heater control system uses a proportional-integral-derivative loop to control the temperature at the compaction point (e.g., at the interface of the compaction roller and a newly laid tow) and regulate the heater power to achieve the desired temperature.

US Patent:

20200088692, Mar 19, 2020

Filed:

Nov 18, 2019

Appl. No.:

16/686869

Inventors:

- Chicago IL, US
Kelly M. Greene - Kent WA, US
John Z. Lin - Renton WA, US
Carlyn R. Brewer - Newcastle WA, US
Russell Lee Keller - Maple Valley WA, US

International Classification:

G01N 29/44
G01N 29/04
G06F 17/50

Abstract:

A method for analyzing a structure includes processing nondestructive inspection (NDI) data for a multi-layer structure to define areas of inconsistency at an internal layer or an interface between adjacent layers. The method includes mapping the areas of inconsistency to finite elements of a finite element model of a nominal of the structure. These finite elements are thereby identified as affected finite elements and include finite elements for the affected internal layer or interface. The method includes producing a reconstructed finite element model of the affected structure from the nominal finite element model, and a modified property or state value assigned to respective element datasets of the affected finite elements. The method includes performing a finite element method (FEM) failure analysis of the reconstructed finite element model under a load, which indicates an extent of residual integrity of the affected structure.

US Patent:

20190061282, Feb 28, 2019

Filed:

Aug 29, 2017

Appl. No.:

15/689703

Inventors:

- Chicago IL, US
Samuel F. Pedigo - Lake Forest Park WA, US
Sayata Ghose - Sammamish WA, US
John Z. Lin - Renton WA, US

Assignee:

The Boeing Company - Chicago IL

International Classification:

B29C 70/38
B29C 35/08
B29C 35/02

Abstract:

Closed-loop systems and methods for controlling the temperature at the compaction point as an automated fiber placement (AFP) machine is placing material over complex surface features at varying speeds. The closed-loop system starts with multiple infrared temperature sensors directed at the layup surface in front of the compaction roller and also at the new layup surface behind the compaction roller. These sensors supply direct temperature readings to a control computer, which also receives speed data and a listing of active tows from the AFP machine and is also programmed with the number of plies in the current layup. In accordance with one embodiment, the heater control system uses a proportional-integral-derivative loop to control the temperature at the compaction point (e.g., at the interface of the compaction roller and a newly laid tow) and regulate the heater power to achieve the desired temperature.

US Patent:

20180201655, Jul 19, 2018

Filed:

Nov 22, 2017

Appl. No.:

15/821574

Inventors:

- Oakland CA, US
John Lin - Del Mar CA, US
Roger Tsien - Eugene OR, US
Richard Ting - New York NY, US
Geraldine Tran - La Jolla CA, US

International Classification:

C07K 14/195

Abstract:

The invention provides evolved red-shifted smURFPs. In some embodiments, the smURFPs are characterized by a) increased Fluorescence of smURFP as compared to infrared FPs IFP1.4 and iRFP713; b) expressing efficiently with minimal toxicity; c) does not require a lyase to covalently attach its chromophore, wherein the chromophore is biliverdin; d) exhibit a wavelengths longer than attainable with jellyfish- or coral-derived FPs using smURFP and IFP2.0; e) allows for functional fusion to hCdt1(30/120) as compared to jellyfish- or coral-derived FPs mAG, eGFP, and mRFP1 which are nonfunctional; and f) allows for deep tissue imaging.

US Patent:

20180120268, May 3, 2018

Filed:

Oct 31, 2016

Appl. No.:

15/339114

Inventors:

- Chicago IL, US
Jill P. Bingham - Seattle WA, US
Hong Hue Tat - Redmond WA, US
Yuan-Jye Wu - Issaquah WA, US
John M. Pryor - Lake Forest Park WA, US
Sadie L. Fieni - Charleston SC, US
Mark D. Winters - Maple Valley WA, US
Kathryn T. Moore - Los Alamitos CA, US
James C. Kennedy - Renton WA, US
Clayton M. Little - Mount Pleasant SC, US
John Z. Lin - Renton WA, US

Assignee:

The Boeing Company - Chicago IL

International Classification:

G01N 29/30
G01N 29/07
G06F 17/50

Abstract:

Methods that provide wrinkle characterization and performance prediction for wrinkled composite structures using automated structural analysis. In accordance with some embodiments, the method combines the use of B-scan ultrasound data, automated optical measurement of wrinkles and geometry of cross-sections, and finite element analysis of wrinkled composite structure to provide the ability to assess the actual significance of a detected wrinkle relative to the intended performance of the structure. The disclosed method uses an ultrasonic inspection system that has been calibrated by correlating ultrasonic B-scan data acquired from reference standards with measurements of optical cross sections (e.g., micrographs) of those reference standards.