John H Spalding

US Patent:

7633046, Dec 15, 2009

Filed:

Oct 23, 2007

Appl. No.:

11/977097

Inventors:

John D. Spalding - Ann Arbor MI, US

Assignee:

GII Acquisition LLC - Davisburg MI

International Classification:

G06M 1/00
H01J 40/14
G01B 11/02

US Classification:

250221, 2502221, 356635

Abstract:

A method for estimating thread parameters of a part which moves relative to a stage and a plurality of sensors which measure the amount of radiation contained in directed planar portions of radiation unobstructed by the part is provided. The amount of radiation is representative of a respective geometric dimension of the part. The method includes obtaining calibrated part data from an inspection region between position limits of the stage. The calibrated part data includes calibrated sensor data for each sensor of the system and its corresponding coordinate system. The method further includes processing the calibrated part data to obtain intermediate data. The method still further includes analyzing the intermediate data to produce estimates of the thread parameters of the part.

US Patent:

7633634, Dec 15, 2009

Filed:

Oct 23, 2007

Appl. No.:

11/977102

Inventors:

John D. Spalding - Ann Arbor MI, US
Paul L. Bourget - Kentwood MI, US

Assignee:

GII Acquisition, LLC - Davisburg MI

International Classification:

G01B 11/02

US Classification:

356635, 356638

Abstract:

Optical modules and a method of precisely assembling the modules are provided. The method includes the step of providing a set of optical components including a plurality of beam shaping components for converting at least one initial shape in cross section of a laser beam to at least one desired shape in cross section and an optical mount for supporting the set of optical components. The method further includes holding and locating the optical mount relative to a reference axis. The method still further includes holding the optical components in position relative to the optical mount during the step of holding and locating wherein the positions of the beam shaping components are initial positions. The method includes directing a laser beam having the at least one initial shape at the set of optical components during the step of holding the optical components. The method further includes adjusting the initial positions of the beam shaping components to obtain final positions of the beam shaping components relative to the optical mount during the step of directing until the laser beam has the at least one desired shape.

US Patent:

7738088, Jun 15, 2010

Filed:

Oct 23, 2007

Appl. No.:

11/975977

Inventors:

John D. Spalding - Ann Arbor MI, US

Assignee:

GII Acquisition, LLC - Davisburg MI

International Classification:

G01J 1/00
G06M 1/00

US Classification:

356228, 356 513, 3562431, 250216, 2502081, 2502221

Abstract:

An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system.

US Patent:

7738121, Jun 15, 2010

Filed:

Oct 23, 2007

Appl. No.:

11/977010

Inventors:

John D. Spalding - Ann Arbor MI, US

Assignee:

GII Acquisition, LLC - Davisburg MI

International Classification:

G01B 11/04

US Classification:

356638, 356639, 25055924

Abstract:

A method and inspection head apparatus for optically measuring geometric dimensions of a part are provided. The method optically measures the geometric dimensions of a part having a part axis at an inspection station. The method includes directing an array of spaced planes of radiation at the part so that the part occludes each of the planes of radiation at spaced locations along the part axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method further includes measuring the amount of radiation present in each of the unobstructed planar portions.

US Patent:

7755754, Jul 13, 2010

Filed:

Oct 23, 2007

Appl. No.:

11/977114

Inventors:

John D. Spalding - Ann Arbor MI, US

Assignee:

GII Acquisition, LLC - Davisburg MI

International Classification:

G01J 1/10

US Classification:

3562431

Abstract:

A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system. A profile of the slope edge regions and the sloped region contains information for calibrating the system.

US Patent:

7796278, Sep 14, 2010

Filed:

Sep 19, 2008

Appl. No.:

12/233821

Inventors:

John D. Spalding - Ann Arbor MI, US
Eric M. Walstra - Clarkston MI, US

Assignee:

GII Acquisition, LLC - Davisburg MI

International Classification:

G01B 11/04
G01B 11/08
G01M 1/00

US Classification:

356639, 356638, 356608, 356 513, 3562431, 250216, 2502081, 2502221

Abstract:

A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes. If the geometric measurement is outside an acceptable range of geometric values, the method may further include repositioning the part until the geometric measurement between the axes at the measurement interval is within the acceptable range of geometric values.

US Patent:

7907267, Mar 15, 2011

Filed:

May 14, 2010

Appl. No.:

12/780054

Inventors:

John D. Spalding - Ann Arbor MI, US

Assignee:

GII Acquisition, LLC - Davisburg MI

International Classification:

G01J 1/00
G06M 1/00

US Classification:

356228, 356 513, 3562431, 250216, 2502081, 2502221

Abstract:

An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system.

US Patent:

8013990, Sep 6, 2011

Filed:

May 12, 2010

Appl. No.:

12/778721

Inventors:

John D. Spalding - Ann Arbor MI, US

Assignee:

GII Acquisition, LLC - Davisburg MI

International Classification:

G01J 1/00

US Classification:

3562431

Abstract:

A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system. A profile of the slope edge regions and the sloped region contains information for calibrating the system.