John R Strom

US Patent:

8466703, Jun 18, 2013

Filed:

Aug 24, 2010

Appl. No.:

12/862375

Inventors:

Eric Endres - Issaquah WA, US
John T. Strom - North Bend WA, US
Christian Kuwasaki - Sammamish WA, US
Christopher McLaughlin - Minneapolis MN, US

Assignee:

Rudolph Technologies, Inc. - Flanders NJ

International Classification:

G01R 1/067

US Classification:

32475501, 32475505, 32475016, 32475603

Abstract:

A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.

US Patent:

20190331322, Oct 31, 2019

Filed:

Apr 25, 2018

Appl. No.:

15/962578

Inventors:

- Dublin 4, IE
Timothy Bingaman - Thornton CO, US
Jason Medric Eubanks - Long Beach NY, US
John Strom - Commerce City CO, US
John Leon - Parker CO, US

International Classification:

F21V 15/015
F21V 17/10
F21V 5/04

Abstract:

A linear light fixture can include a housing that includes at least one wall that forms a cavity. The linear light fixture can also a light board having multiple light sources disposed thereon, where the light sources are arranged in a linear fashion with respect to each other on the light board, where the light board is disposed within the cavity of the housing. The linear light fixture can further include a lens slidably disposed within a receiving feature of the housing. The linear light fixture can also include a first auxiliary optical member disposed within cavity of the housing, where the first auxiliary optical member includes a first body having a first end and a second end, where the first body includes a light diffusion film. The first auxiliary optical member can fill a first gap between the lens and a first side wall of the housing.