John Y Yu

US Patent:

20180373969, Dec 27, 2018

Filed:

Jun 23, 2017

Appl. No.:

15/631986

Inventors:

- Chicago IL, US
Jack Fredrickson - Kirkland WA, US
William David Kelsey - Issaquah WA, US
John Jiang Yu - Seattle WA, US
Edward Li - Seattle WA, US
Brian James Smith - Bellevue WA, US

International Classification:

G06K 17/00
G01S 5/02

Abstract:

A method for high density radio frequency identifier (RFID) scanning is provided. The method includes receiving a plurality of response signals from a plurality of RFID components. Where each of the plurality of response signals includes a part number and a serial number associated with the RFID component. The method also includes receiving, from a location device, a location of the scanning device. For each of the plurality of RFID components, the method includes determining a component location, the serial number, and the part number based on a corresponding response signal, comparing the component location to an expected location of the RFID component, determining a level of correlation between the serial number associated with the corresponding response signal and a stored serial number associated with the part number, and calculating a confidence score based on the corresponding comparison and the level of correlation.